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Avtomat. i Telemekh., 1990, Issue 9, Pages 118–129 (Mi at5937)  

Technical Diagnostics

Logical Dynamic Testing of Synchronous CMOS VLSI

V. M. Krivoshapko, D. O. Levitsky

Moscow Electronic Engineering Institute

Full text: PDF file (1722 kB)

English version:
Automation and Remote Control, 1990, 51:9, 1258–1266

Bibliographic databases:
UDC: 621.382.8:681.326.7

Received: 14.04.1989

Citation: V. M. Krivoshapko, D. O. Levitsky, “Logical Dynamic Testing of Synchronous CMOS VLSI”, Avtomat. i Telemekh., 1990, no. 9, 118–129; Autom. Remote Control, 51:9 (1990), 1258–1266

Citation in format AMSBIB
\Bibitem{KriLev90}
\by V.~M.~Krivoshapko, D.~O.~Levitsky
\paper Logical Dynamic Testing of Synchronous CMOS VLSI
\jour Avtomat. i Telemekh.
\yr 1990
\issue 9
\pages 118--129
\mathnet{http://mi.mathnet.ru/at5937}
\zmath{https://zbmath.org/?q=an:0727.94011}
\transl
\jour Autom. Remote Control
\yr 1990
\vol 51
\issue 9
\pages 1258--1266


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