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Computer Optics, 2016, Volume 40, Issue 4, Pages 594–599 (Mi co255)  

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Measuring the thickness of Z-cut uniaxial crystals based on Bessel laser beams

V. D. Paranin

Samara National Research University, Samara, Russia

Abstract: An optical method for measuring the thickness of z-cut uniaxial crystals is proposed. The method uses a periodic mutual conversion of zero- and second-order Bessel beams observed during their propagation along the optical axis of a uniaxial crystal. The paper presents the theoretical background and features of the practical implementation of the measuring method. The applicability of the method for measuring thicknesses ranging from tens of micrometers up to tens of millimeters is shown for a lithium niobate crystal.

Keywords: Bessel beam, birefringence crystal, lithium niobate, thickness measurement, tolerance, image processing.

Funding Agency Grant Number
Ministry of Education and Science of the Russian Federation
Russian Foundation for Basic Research 16-29-11698-_
16-07-00825-
The work was supported by the Russian Federation Ministry of Education and Science, as well as RFBR 16-29-11698-ofi_m, grants 16-07-00825.


DOI: https://doi.org/10.18287/2412-6179-2016-40-4-594-599

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Full text: http://www.computeroptics.smr.ru/.../400420.html
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Received: 24.06.2016
Accepted:21.08.2016

Citation: V. D. Paranin, “Measuring the thickness of Z-cut uniaxial crystals based on Bessel laser beams”, Computer Optics, 40:4 (2016), 594–599

Citation in format AMSBIB
\Bibitem{Par16}
\by V.~D.~Paranin
\paper Measuring the thickness of Z-cut uniaxial crystals based on Bessel laser beams
\jour Computer Optics
\yr 2016
\vol 40
\issue 4
\pages 594--599
\mathnet{http://mi.mathnet.ru/co255}
\crossref{https://doi.org/10.18287/2412-6179-2016-40-4-594-599}


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