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Computer Optics, 2016, Volume 40, Issue 6, Pages 837–843 (Mi co334)  

OPTO-IT

Determination of organic contaminant concentration on the silica surface by lateral force microscopy

N. A. Ivlievab, V. A. Kolpakova, S. V. Krichevskiya

a Samara National Research University, Samara, Russia
b Image Processing Systems Institute of the RAS - Branch of the FSRC "Crystallography and Photonics" RAS, Samara, Russia

Abstract: We present a method for determining the concentration of organic contaminants on the silica surface by using lateral force maps and surface topology images obtained with scanning probe microscopy. In this study, we optimized the scanning frequency to increase the contrast of images and facilitate interpretation of the data obtained. We also proved experimentally that the sensitivity of the method reaches $10^{-11}$ g/cm$^2$.

Keywords: concentration of organic contaminants, lateral force.

Funding Agency Grant Number
Ministry of Education and Science of the Russian Federation -5205.2016.9
Russian Foundation for Basic Research 16-07-00494
The work was partially funded by Presidential grants for support of young Russian doctors of science (MD-5205.2016.9) and Russian Foundation of Basic Research grants (project 16-07-00494 A).


DOI: https://doi.org/10.18287/2412-6179-2016-40-6-837-843

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Full text: http://www.computeroptics.smr.ru/.../400609.html
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Received: 21.11.2016
Accepted:09.12.2016

Citation: N. A. Ivliev, V. A. Kolpakov, S. V. Krichevskiy, “Determination of organic contaminant concentration on the silica surface by lateral force microscopy”, Computer Optics, 40:6 (2016), 837–843

Citation in format AMSBIB
\Bibitem{IvlKolKri16}
\by N.~A.~Ivliev, V.~A.~Kolpakov, S.~V.~Krichevskiy
\paper Determination of organic contaminant concentration on the silica surface by lateral force microscopy
\jour Computer Optics
\yr 2016
\vol 40
\issue 6
\pages 837--843
\mathnet{http://mi.mathnet.ru/co334}
\crossref{https://doi.org/10.18287/2412-6179-2016-40-6-837-843}


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