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Computer Optics, 2018, Volume 42, Issue 1, Pages 54–59 (Mi co478)  

OPTO-IT

Self-mixing interferometry for distance measurement using a semiconductor laser with current-modulated wavelength

D. A. Usanov, A. V. Skripal, E. I. Astakhov, I. Kostuchenko, S. Yu. Dobdin

Saratov State University, Saratov, Russia

Abstract: The capabilities of the method of current-modulated laser wavelength are shown to be extended by using harmonic modulation. Advantages of the sawtooth modulation method associated with using the frequency measurements of the interference signal as an information parameter have been researched. Advantages of the harmonic-type modulation based on the use of measurement results for spectral component amplitudes of the interference signal for distance determination have also been investigated. A comparative analysis of methods for absolute distance measurements at the existing capabilities of semiconductor laser wavelength modulation has demonstrated the benefits of the harmonic modulation of laser diode current for distances under 30 cm, showing the sawtooth current modulation to work better for distances greater than 50 cm.

Keywords: semiconductor laser, self-mixing interferometry, distance measurement, wavelength modulation.

Funding Agency Grant Number
Ministry of Education and Science of the Russian Federation 8.7628.2017
The work was funded by the Ministry of Education and Science of the Russian Federation (state task # 8.7628.2017).


DOI: https://doi.org/10.18287/2412-6179-2018-42-1-54-59

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Full text: http://www.computeroptics.smr.ru/.../420107.html
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Received: 25.06.2017
Accepted:02.10.2017

Citation: D. A. Usanov, A. V. Skripal, E. I. Astakhov, I. Kostuchenko, S. Yu. Dobdin, “Self-mixing interferometry for distance measurement using a semiconductor laser with current-modulated wavelength”, Computer Optics, 42:1 (2018), 54–59

Citation in format AMSBIB
\Bibitem{UsaSkrAst18}
\by D.~A.~Usanov, A.~V.~Skripal, E.~I.~Astakhov, I.~Kostuchenko, S.~Yu.~Dobdin
\paper Self-mixing interferometry for distance measurement using a semiconductor laser with current-modulated wavelength
\jour Computer Optics
\yr 2018
\vol 42
\issue 1
\pages 54--59
\mathnet{http://mi.mathnet.ru/co478}
\crossref{https://doi.org/10.18287/2412-6179-2018-42-1-54-59}


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