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Diskretn. Anal. Issled. Oper., 2017, Volume 24, Issue 3, Pages 80–103 (Mi da876)  

This article is cited in 3 scientific papers (total in 3 papers)

On the exact value of the length of the minimal single diagnostic test for a particular class of circuits

K. A. Popkov

Keldysh Institute of Applied Mathematics, 4 Miusskaya Sq., 125047 Moscow, Russia

Abstract: Under consideration is the problem of synthesis of irredundant logic circuits in the basis $\{\mathbin&,\vee,\neg\}$ which implement Boolean functions of $n$ variables and allow some short single diagnostic tests regarding uniform constant faults at outputs of gates. For each Boolean function permitting implementation by an irredundant circuit, the minimal possible length value of such a test is found. In particular, we prove that this value is at most $2$. Illustr. 3, bibliogr. 27.

Keywords: logic circuit, fault, single diagnostic test.

Funding Agency Grant Number
Russian Foundation for Basic Research 14-01-00598_а
Russian Academy of Sciences - Federal Agency for Scientific Organizations


DOI: https://doi.org/10.17377/daio.2017.24.546

Full text: PDF file (393 kB)
References: PDF file   HTML file

English version:
Journal of Applied and Industrial Mathematics, 2017, 11:3, 431–443

UDC: 519.718.7
Received: 08.06.2016
Revised: 27.02.2017

Citation: K. A. Popkov, “On the exact value of the length of the minimal single diagnostic test for a particular class of circuits”, Diskretn. Anal. Issled. Oper., 24:3 (2017), 80–103; J. Appl. Industr. Math., 11:3 (2017), 431–443

Citation in format AMSBIB
\Bibitem{Pop17}
\by K.~A.~Popkov
\paper On the exact value of the length of the minimal single diagnostic test for a particular class of circuits
\jour Diskretn. Anal. Issled. Oper.
\yr 2017
\vol 24
\issue 3
\pages 80--103
\mathnet{http://mi.mathnet.ru/da876}
\crossref{https://doi.org/10.17377/daio.2017.24.546}
\elib{https://elibrary.ru/item.asp?id=29869484}
\transl
\jour J. Appl. Industr. Math.
\yr 2017
\vol 11
\issue 3
\pages 431--443
\crossref{https://doi.org/10.1134/S1990478917030140}
\scopus{https://www.scopus.com/record/display.url?origin=inward&eid=2-s2.0-85028539308}


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    Citing articles on Google Scholar: Russian citations, English citations
    Related articles on Google Scholar: Russian articles, English articles

    This publication is cited in the following articles:
    1. K. A. Popkov, “Complete fault detection tests of length 2 for logic networks under stuck-at faults of gates”, J. Appl. Industr. Math., 12:2 (2018), 302–312  mathnet  crossref  crossref  elib
    2. K. A. Popkov, “Short single tests for circuits with arbitrary stuck-at faults at outputs of gates”, Discrete Math. Appl., 29:5 (2019), 321–333  mathnet  crossref  crossref  mathscinet  isi  elib
    3. K. A. Popkov, “Metod postroeniya legko diagnostiruemykh skhem iz funktsionalnykh elementov otnositelno edinichnykh neispravnostei”, PDM, 2019, no. 46, 38–57  mathnet  crossref
  • Дискретный анализ и исследование операций
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