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Dokl. Akad. Nauk SSSR, 1975, Volume 224, Number 1, Pages 88–91 (Mi dan39261)  

CRYSTALLOGRAPHY

X-Ray spectral study of silicates. I. Structure of silicon $L_{\mathrm{II},\mathrm{III}}$ band

Yu. P. Dikov, Yu. N. Romashchenko, I. A. Brytov, V. V. Nemoshkalenko

Scientific-Research Institute of Glass, Moscow

Full text: PDF file (681 kB)

Document Type: Article
UDC: 543.422.8:546.284
Presented: N. V. Belov
Received: 02.01.1975

Citation: Yu. P. Dikov, Yu. N. Romashchenko, I. A. Brytov, V. V. Nemoshkalenko, “X-Ray spectral study of silicates. I. Structure of silicon $L_{\mathrm{II},\mathrm{III}}$ band”, Dokl. Akad. Nauk SSSR, 224:1 (1975), 88–91

Citation in format AMSBIB
\Bibitem{DikRomBry75}
\by Yu.~P.~Dikov, Yu.~N.~Romashchenko, I.~A.~Brytov, V.~V.~Nemoshkalenko
\paper X-Ray spectral study of silicates. I.~Structure of silicon $L_{\mathrm{II},\mathrm{III}}$ band
\jour Dokl. Akad. Nauk SSSR
\yr 1975
\vol 224
\issue 1
\pages 88--91
\mathnet{http://mi.mathnet.ru/dan39261}


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