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Dokl. Akad. Nauk SSSR, 1983, Volume 269, Number 3, Pages 607–609 (Mi dan46021)  

CRYSTALLOGRAPHY

Auger-electronic microanalysis of oxidized lead sulfide polycrystalline layer

A. M. Gaskov, A. A. Gol'denveizer, I. A. Sokolov, V. P. Zlomanov, A. V. Novoselova


Full text: PDF file (433 kB)
UDC: 546.817'681'24
Received: 23.11.1982

Citation: A. M. Gaskov, A. A. Gol'denveizer, I. A. Sokolov, V. P. Zlomanov, A. V. Novoselova, “Auger-electronic microanalysis of oxidized lead sulfide polycrystalline layer”, Dokl. Akad. Nauk SSSR, 269:3 (1983), 607–609

Citation in format AMSBIB
\Bibitem{GasGolSok83}
\by A.~M.~Gaskov, A.~A.~Gol'denveizer, I.~A.~Sokolov, V.~P.~Zlomanov, A.~V.~Novoselova
\paper Auger-electronic microanalysis of oxidized lead sulfide polycrystalline layer
\jour Dokl. Akad. Nauk SSSR
\yr 1983
\vol 269
\issue 3
\pages 607--609
\mathnet{http://mi.mathnet.ru/dan46021}


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