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Diskr. Mat., 2010, Volume 22, Issue 3, Pages 127–133 (Mi dm1112)  

This article is cited in 19 scientific papers (total in 19 papers)

Synthesis of easily testable circuits over the Zhegalkin basis in the case of constant faults of type 0 at outputs of elements

Yu. V. Borodina, P. A. Borodin


Abstract: Methods of synthesis of easily testable circuits of functional elements over the Zhegalkin basis for arbitrary Boolean functions are suggested. It is assumed that the faults are constant faults of type 0 at outputs of elements. It is proved that any Boolean function can be realised by a circuit allowing a complete test of length 1.

DOI: https://doi.org/10.4213/dm1112

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English version:
Discrete Mathematics and Applications, 2010, 20:4, 441–449

Bibliographic databases:

UDC: 519.7
Received: 23.01.2009

Citation: Yu. V. Borodina, P. A. Borodin, “Synthesis of easily testable circuits over the Zhegalkin basis in the case of constant faults of type 0 at outputs of elements”, Diskr. Mat., 22:3 (2010), 127–133; Discrete Math. Appl., 20:4 (2010), 441–449

Citation in format AMSBIB
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\paper Synthesis of easily testable circuits over the Zhegalkin basis in the case of constant faults of type~0 at outputs of elements
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\vol 22
\issue 3
\pages 127--133
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\jour Discrete Math. Appl.
\yr 2010
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    Citing articles on Google Scholar: Russian citations, English citations
    Related articles on Google Scholar: Russian articles, English articles

    This publication is cited in the following articles:
    1. D. S. Romanov, “A method for synthesis of easily-testable circuits in some basis admitting single fault detection tests of constant length”, Moscow University Mathematics Bulletin, 67:2 (2012), 69–73  mathnet  crossref  mathscinet
    2. D. S. Romanov, “On the synthesis of circuits admitting complete fault detection test sets of constant length under arbitrary constant faults at the outputs of the gates”, Discrete Math. Appl., 23:3-4 (2013), 343–362  mathnet  crossref  crossref  mathscinet  elib  elib
    3. D. S. Romanov, “Method of synthesis of easily testable circuits admitting single fault detection tests of constant length”, Discrete Math. Appl., 24:4 (2014), 227–251  mathnet  crossref  crossref  mathscinet  elib
    4. K. A. Popkov, “O tochnom znachenii dliny minimalnogo edinichnogo diagnosticheskogo testa dlya odnogo klassa skhem”, Preprinty IPM im. M. V. Keldysha, 2015, 074, 20 pp.  mathnet
    5. K. A. Popkov, “O edinichnykh diagnosticheskikh testakh dlya skhem iz funktsionalnykh elementov v bazise Zhegalkina”, Preprinty IPM im. M. V. Keldysha, 2016, 050, 16 pp.  mathnet  crossref
    6. K. A. Popkov, “Nizhnie otsenki dlin edinichnykh testov dlya skhem iz funktsionalnykh elementov”, Preprinty IPM im. M. V. Keldysha, 2016, 139, 21 pp.  mathnet  crossref
    7. K. A. Popkov, “Edinichnye proveryayuschie testy dlya skhem iz funktsionalnykh elementov v bazise «kon'yunktsiya-otritsanie»”, Preprinty IPM im. M. V. Keldysha, 2017, 030, 31 pp.  mathnet  crossref
    8. K. A. Popkov, “Lower bounds for lengths of single tests for Boolean circuits”, Discrete Math. Appl., 29:1 (2019), 23–33  mathnet  crossref  crossref  isi  elib
    9. K. A. Popkov, “On the exact value of the length of the minimal single diagnostic test for a particular class of circuits”, J. Appl. Industr. Math., 11:3 (2017), 431–443  mathnet  crossref  crossref  elib
    10. N. P. Red'kin, “Length of Diagnostic Tests for Boolean Circuits”, Math. Notes, 102:4 (2017), 580–582  mathnet  crossref  crossref  mathscinet  isi  elib
    11. D. S. Romanov, E. Yu. Romanova, “A method of synthesis of irredundant circuits admitting single fault detection tests of constant length”, Discrete Math. Appl., 29:1 (2019), 35–48  mathnet  crossref  crossref  isi  elib
    12. K. A. Popkov, “Polnye proveryayuschie testy dliny dva dlya skhem pri proizvolnykh konstantnykh neispravnostyakh elementov”, Preprinty IPM im. M. V. Keldysha, 2017, 104, 16 pp.  mathnet  crossref
    13. K. A. Popkov, “Edinichnye proveryayuschie testy dlya skhem iz funktsionalnykh elementov v bazise “kon'yunktsiya-otritsanie””, PDM, 2017, no. 38, 66–88  mathnet  crossref
    14. K. A. Popkov, “Complete fault detection tests of length 2 for logic networks under stuck-at faults of gates”, J. Appl. Industr. Math., 12:2 (2018), 302–312  mathnet  crossref  crossref  elib
    15. K. A. Popkov, “Short single tests for circuits with arbitrary stuck-at faults at outputs of gates”, Discrete Math. Appl., 29:5 (2019), 321–333  mathnet  crossref  crossref  isi  elib
    16. K. A. Popkov, “Korotkie edinichnye testy dlya skhem pri proizvolnykh konstantnykh neispravnostyakh na vykhodakh elementov”, Preprinty IPM im. M. V. Keldysha, 2018, 033, 23 pp.  mathnet  crossref  elib
    17. K. A. Popkov, “Korotkie polnye proveryayuschie testy dlya skhem iz dvukhvkhodovykh funktsionalnykh elementov”, Preprinty IPM im. M. V. Keldysha, 2018, 197, 24 pp.  mathnet  crossref  elib
    18. K. A. Popkov, “Short complete fault detection tests for logic networks with fan-in two”, J. Appl. Industr. Math., 13:1 (2019), 118–131  mathnet  crossref  crossref
    19. Yu. V. Borodina, “Legkotestiruemye skhemy v bazise Zhegalkina pri konstantnykh neispravnostyakh tipa “1” na vykhodakh elementov”, Diskret. matem., 31:2 (2019), 14–19  mathnet  crossref  elib
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