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This article is cited in 14 scientific papers (total in 14 papers)
Method of synthesis of easily testable circuits admitting single fault detection tests of constant length
D. S. Romanov
M. V. Lomonosov Moscow State University
DOI:
https://doi.org/10.4213/dm1283
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English version:
Discrete Mathematics and Applications, 2014, 24:4, 227–251
Bibliographic databases:
  
UDC:
519.718
Received: 24.04.2012
Citation:
D. S. Romanov, “Method of synthesis of easily testable circuits admitting single fault detection tests of constant length”, Diskr. Mat., 26:2 (2014), 100–130; Discrete Math. Appl., 24:4 (2014), 227–251
Citation in format AMSBIB
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\transl
\jour Discrete Math. Appl.
\yr 2014
\vol 24
\issue 4
\pages 227--251
\crossref{https://doi.org/10.1515/dma-2014-0021}
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Linking options:
http://mi.mathnet.ru/eng/dm1283https://doi.org/10.4213/dm1283 http://mi.mathnet.ru/eng/dm/v26/i2/p100
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This publication is cited in the following articles:
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K. A. Popkov, “Estimations on lengths of tests of functional elements under a large number of permissible faults”, J. Appl. Industr. Math., 9:4 (2015), 559–569
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K. A. Popkov, “O tochnom znachenii dliny minimalnogo edinichnogo diagnosticheskogo testa dlya odnogo klassa skhem”, Preprinty IPM im. M. V. Keldysha, 2015, 074, 20 pp.
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K. A. Popkov, “O edinichnykh diagnosticheskikh testakh dlya skhem iz funktsionalnykh elementov v bazise Zhegalkina”, Preprinty IPM im. M. V. Keldysha, 2016, 050, 16 pp.
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K. A. Popkov, “Nizhnie otsenki dlin edinichnykh testov dlya skhem iz funktsionalnykh elementov”, Preprinty IPM im. M. V. Keldysha, 2016, 139, 21 pp.
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K. A. Popkov, “Edinichnye proveryayuschie testy dlya skhem iz funktsionalnykh elementov v bazise «kon'yunktsiya-otritsanie»”, Preprinty IPM im. M. V. Keldysha, 2017, 030, 31 pp.
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K. A. Popkov, “Lower bounds for lengths of single tests for Boolean circuits”, Discrete Math. Appl., 29:1 (2019), 23–33
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K. A. Popkov, “On the exact value of the length of the minimal single diagnostic test for a particular class of circuits”, J. Appl. Industr. Math., 11:3 (2017), 431–443
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N. P. Red'kin, “Length of Diagnostic Tests for Boolean Circuits”, Math. Notes, 102:4 (2017), 580–582
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D. S. Romanov, E. Yu. Romanova, “A method of synthesis of irredundant circuits admitting single fault detection tests of constant length”, Discrete Math. Appl., 29:1 (2019), 35–48
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K. A. Popkov, “Polnye proveryayuschie testy dliny dva dlya skhem pri proizvolnykh konstantnykh neispravnostyakh elementov”, Preprinty IPM im. M. V. Keldysha, 2017, 104, 16 pp.
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K. A. Popkov, “Edinichnye proveryayuschie testy dlya skhem iz funktsionalnykh elementov v bazise “kon'yunktsiya-otritsanie””, PDM, 2017, no. 38, 66–88
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K. A. Popkov, “Complete fault detection tests of length 2 for logic networks under stuck-at faults of gates”, J. Appl. Industr. Math., 12:2 (2018), 302–312
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K. A. Popkov, “Short single tests for circuits with arbitrary stuck-at faults at outputs of gates”, Discrete Math. Appl., 29:5 (2019), 321–333
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K. A. Popkov, “Korotkie edinichnye testy dlya skhem pri proizvolnykh konstantnykh neispravnostyakh na vykhodakh elementov”, Preprinty IPM im. M. V. Keldysha, 2018, 033, 23 pp.
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