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Keldysh Institute preprints, 2015, 074, 20 pp. (Mi ipmp2036)  

This article is cited in 8 scientific papers (total in 8 papers)

On an exact length value of a minimal single diagnostic test for one class of circuits

K. A. Popkov


Abstract: We consider a problem of synthesis of irredundant logic circuits in the basis $\{&,\lor,\lnot\}$ which realize Boolean functions on $n$ variables and allow short single diagnostic tests regarding uniform constant faults on outputs of gates. For each Boolean function permitting realization by an irredundant circuit, the minimal possible length value of such a test is found. In particular, it is proved that this value does not exceed two.

Keywords: logic circuit, fault, single diagnostic test.

Funding Agency Grant Number
Russian Foundation for Basic Research 14-01-00598
Программа фундаментальных исследований ОМН РАН «Алгебраические и комбинаторные методы математической кибернетики и информационные системы нового поколения» (проект «Задачи оптимального синтеза управляющих систем»)


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Citation: K. A. Popkov, “On an exact length value of a minimal single diagnostic test for one class of circuits”, Keldysh Institute preprints, 2015, 074, 20 pp.

Citation in format AMSBIB
\Bibitem{Pop15}
\by K.~A.~Popkov
\paper On an exact length value of a minimal single diagnostic test for one class of circuits
\jour Keldysh Institute preprints
\yr 2015
\papernumber 074
\totalpages 20
\mathnet{http://mi.mathnet.ru/ipmp2036}


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  • http://mi.mathnet.ru/eng/ipmp/y2015/p74

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    Citing articles on Google Scholar: Russian citations, English citations
    Related articles on Google Scholar: Russian articles, English articles

    This publication is cited in the following articles:
    1. K. A. Popkov, “O edinichnykh diagnosticheskikh testakh dlya skhem iz funktsionalnykh elementov v bazise Zhegalkina”, Preprinty IPM im. M. V. Keldysha, 2016, 050, 16 pp.  mathnet  crossref
    2. K. A. Popkov, “Nizhnie otsenki dlin edinichnykh testov dlya skhem iz funktsionalnykh elementov”, Preprinty IPM im. M. V. Keldysha, 2016, 139, 21 pp.  mathnet  crossref
    3. K. A. Popkov, “Edinichnye proveryayuschie testy dlya skhem iz funktsionalnykh elementov v bazise «kon'yunktsiya-otritsanie»”, Preprinty IPM im. M. V. Keldysha, 2017, 030, 31 pp.  mathnet  crossref
    4. N. P. Red'kin, “Length of Diagnostic Tests for Boolean Circuits”, Math. Notes, 102:4 (2017), 580–582  mathnet  crossref  crossref  mathscinet  isi  elib
    5. D. S. Romanov, E. Yu. Romanova, “A method of synthesis of irredundant circuits admitting single fault detection tests of constant length”, Discrete Math. Appl., 29:1 (2019), 35–48  mathnet  crossref  crossref  isi  elib
    6. K. A. Popkov, “Polnye proveryayuschie testy dliny dva dlya skhem pri proizvolnykh konstantnykh neispravnostyakh elementov”, Preprinty IPM im. M. V. Keldysha, 2017, 104, 16 pp.  mathnet  crossref
    7. K. A. Popkov, “Korotkie edinichnye testy dlya skhem pri proizvolnykh konstantnykh neispravnostyakh na vykhodakh elementov”, Preprinty IPM im. M. V. Keldysha, 2018, 033, 23 pp.  mathnet  crossref  elib
    8. K. A. Popkov, “Metod postroeniya legko diagnostiruemykh skhem iz funktsionalnykh elementov otnositelno edinichnykh neispravnostei”, Preprinty IPM im. M. V. Keldysha, 2019, 081, 29 pp.  mathnet  crossref  elib
  • Препринты Института прикладной математики им. М. В. Келдыша РАН
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