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Keldysh Institute preprints, 2016, 050, 16 pp. (Mi ipmp2126)  

This article is cited in 7 scientific papers (total in 7 papers)

On single diagnostic tests for logic circuits in the Zhegalkin basis

K. A. Popkov


Abstract: We consider a problem of synthesis of irredundant logic circuits in the basis $\{&,\oplus,1,0\}$ which implement Boolean functions on $n$ variables and allow short single diagnostic tests regarding constant faults of type $0$ at outputs of gates. For each Boolean function, the minimal possible length value of such a test is found. In particular, it is proved that this value does not exceed two.

Keywords: logic circuit, fault, single diagnostic test.

Funding Agency Grant Number
Russian Foundation for Basic Research 14-01-00598_
Russian Academy of Sciences - Federal Agency for Scientific Organizations


DOI: https://doi.org/10.20948/prepr-2016-50

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Citation: K. A. Popkov, “On single diagnostic tests for logic circuits in the Zhegalkin basis”, Keldysh Institute preprints, 2016, 050, 16 pp.

Citation in format AMSBIB
\Bibitem{Pop16}
\by K.~A.~Popkov
\paper On single diagnostic tests for logic circuits in the Zhegalkin basis
\jour Keldysh Institute preprints
\yr 2016
\papernumber 050
\totalpages 16
\mathnet{http://mi.mathnet.ru/ipmp2126}
\crossref{https://doi.org/10.20948/prepr-2016-50}


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    Citing articles on Google Scholar: Russian citations, English citations
    Related articles on Google Scholar: Russian articles, English articles

    This publication is cited in the following articles:
    1. K. A. Popkov, “Nizhnie otsenki dlin edinichnykh testov dlya skhem iz funktsionalnykh elementov”, Preprinty IPM im. M. V. Keldysha, 2016, 139, 21 pp.  mathnet  crossref
    2. K. A. Popkov, “Edinichnye proveryayuschie testy dlya skhem iz funktsionalnykh elementov v bazise kon'yunktsiya-otritsanie”, Preprinty IPM im. M. V. Keldysha, 2017, 030, 31 pp.  mathnet  crossref
    3. N. P. Red'kin, “Length of Diagnostic Tests for Boolean Circuits”, Math. Notes, 102:4 (2017), 580–582  mathnet  crossref  crossref  mathscinet  isi  elib
    4. D. S. Romanov, E. Yu. Romanova, “A method of synthesis of irredundant circuits admitting single fault detection tests of constant length”, Discrete Math. Appl., 29:1 (2019), 35–48  mathnet  crossref  crossref  isi  elib
    5. K. A. Popkov, “Polnye proveryayuschie testy dliny dva dlya skhem pri proizvolnykh konstantnykh neispravnostyakh elementov”, Preprinty IPM im. M. V. Keldysha, 2017, 104, 16 pp.  mathnet  crossref
    6. K. A. Popkov, “Korotkie edinichnye testy dlya skhem pri proizvolnykh konstantnykh neispravnostyakh na vykhodakh elementov”, Preprinty IPM im. M. V. Keldysha, 2018, 033, 23 pp.  mathnet  crossref  elib
    7. K. A. Popkov, “Metod postroeniya legko diagnostiruemykh skhem iz funktsionalnykh elementov otnositelno edinichnykh neispravnostei”, Preprinty IPM im. M. V. Keldysha, 2019, 081, 29 pp.  mathnet  crossref  elib
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