Preprints of the Keldysh Institute of Applied Mathematics
RUS  ENG    JOURNALS   PEOPLE   ORGANISATIONS   CONFERENCES   SEMINARS   VIDEO LIBRARY   PACKAGE AMSBIB  
General information
Latest issue
Archive

Search papers
Search references

RSS
Latest issue
Current issues
Archive issues
What is RSS



Keldysh Institute preprints:
Year:
Volume:
Issue:
Page:
Find






Personal entry:
Login:
Password:
Save password
Enter
Forgotten password?
Register


Keldysh Institute preprints, 2016, 139, 21 pp. (Mi ipmp2214)  

This article is cited in 2 scientific papers (total in 2 papers)

Lower bounds on lengths of single tests for logic circuits

K. A. Popkov


Abstract: Nontrivial lower bounds on lengths of the minimal single fault detection and diagnostic tests for logic circuits in wide classes of bases in presence of one-type or arbitrary constant faults on outputs of gates are obtained.

Keywords: logic circuit, fault, single fault detection test, single diagnostic test.

Funding Agency Grant Number
Russian Foundation for Basic Research 14-01-00598_а
Russian Academy of Sciences - Federal Agency for Scientific Organizations


DOI: https://doi.org/10.20948/prepr-2016-139

Full text: PDF file (365 kB)
Full text: http:/.../preprint.asp?id=2016-139&lg=r
References: PDF file   HTML file


Citation: K. A. Popkov, “Lower bounds on lengths of single tests for logic circuits”, Keldysh Institute preprints, 2016, 139, 21 pp.

Citation in format AMSBIB
\Bibitem{Pop16}
\by K.~A.~Popkov
\paper Lower bounds on lengths of single tests for logic circuits
\jour Keldysh Institute preprints
\yr 2016
\papernumber 139
\totalpages 21
\mathnet{http://mi.mathnet.ru/ipmp2214}
\crossref{https://doi.org/10.20948/prepr-2016-139}


Linking options:
  • http://mi.mathnet.ru/eng/ipmp2214
  • http://mi.mathnet.ru/eng/ipmp/y2016/p139

    SHARE: VKontakte.ru FaceBook Twitter Mail.ru Livejournal Memori.ru


    Citing articles on Google Scholar: Russian citations, English citations
    Related articles on Google Scholar: Russian articles, English articles

    This publication is cited in the following articles:
    1. K. A. Popkov, “Korotkie edinichnye testy dlya skhem pri proizvolnykh konstantnykh neispravnostyakh na vykhodakh elementov”, Preprinty IPM im. M. V. Keldysha, 2018, 033, 23 pp.  mathnet  crossref  elib
    2. K. A. Popkov, “Metod postroeniya legko diagnostiruemykh skhem iz funktsionalnykh elementov otnositelno edinichnykh neispravnostei”, Preprinty IPM im. M. V. Keldysha, 2019, 081, 29 pp.  mathnet  crossref  elib
  • Препринты Института прикладной математики им. М. В. Келдыша РАН
    Number of views:
    This page:72
    Full text:15
    References:20

     
    Contact us:
     Terms of Use  Registration to the website  Logotypes © Steklov Mathematical Institute RAS, 2021