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Pis'ma v Zh. Èksper. Teoret. Fiz., 2011, Volume 93, Issue 2, Pages 78–82 (Mi jetpl1809)  

This article is cited in 1 scientific paper (total in 1 paper)

CONDENSED MATTER

Effect of small magnetic corrections to susceptibility on the angular dependences of the reflectivity of polarized X-rays from multilayer structures

M. A. Andreeva, E. E. Odintsova

M. V. Lomonosov Moscow State University, Faculty of Physics

Abstract: The X-ray resonant magnetic scattering (XRMS) method allows for the determination of optical constants including magnetic corrections, which are significant near the atomic X-ray absorption edges, by the shift of the Bragg angle of the reflection from periodic multilayers. Recently, Valvidares et al. [Phys. Rev. B 78, 064406 (2008)] revealed significant differences in the shape of “magnetic” Bragg reflection peaks from a $\mathrm{[Co_{73}Si_{27}(50 \mathring A)/Si(30 \mathring A)]_{10}}$ film for two opposite states of antiferromagnetic interlayer ordering. Valvidares et al. assumed that these features can be explained by the presence of the reflection-induced magnetic resonance correction. We have demonstrated that such corrections in the case of antiferromagnetic structures do not lead to a shift of the Bragg peak, but the shape of magnetic peaks is explained by the interference of the magnetic and nonmagnetic reflection amplitudes.

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English version:
Journal of Experimental and Theoretical Physics Letters, 2011, 93:2, 75–79

Bibliographic databases:

Document Type: Article
Received: 03.11.2010
Revised: 29.11.2010

Citation: M. A. Andreeva, E. E. Odintsova, “Effect of small magnetic corrections to susceptibility on the angular dependences of the reflectivity of polarized X-rays from multilayer structures”, Pis'ma v Zh. Èksper. Teoret. Fiz., 93:2 (2011), 78–82; JETP Letters, 93:2 (2011), 75–79

Citation in format AMSBIB
\Bibitem{AndOdi11}
\by M.~A.~Andreeva, E.~E.~Odintsova
\paper Effect of small magnetic corrections to susceptibility on the angular dependences of the reflectivity of polarized X-rays from multilayer structures
\jour Pis'ma v Zh. \`Eksper. Teoret. Fiz.
\yr 2011
\vol 93
\issue 2
\pages 78--82
\mathnet{http://mi.mathnet.ru/jetpl1809}
\transl
\jour JETP Letters
\yr 2011
\vol 93
\issue 2
\pages 75--79
\crossref{https://doi.org/10.1134/S0021364011020020}
\isi{http://gateway.isiknowledge.com/gateway/Gateway.cgi?GWVersion=2&SrcApp=PARTNER_APP&SrcAuth=LinksAMR&DestLinkType=FullRecord&DestApp=ALL_WOS&KeyUT=000288864500007}
\scopus{http://www.scopus.com/record/display.url?origin=inward&eid=2-s2.0-79953141013}


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    Citing articles on Google Scholar: Russian citations, English citations
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    This publication is cited in the following articles:
    1. Andreeva M.A., Odintsova E.E., “X-Ray Circular Dichroism Under Reflection From Antiferromagnetically Coupled Multilayers”, Mosc. Univ. Phys. Bull., 67:2 (2012), 196–200  crossref  adsnasa  isi  elib  elib  scopus
  •       Pis'ma v Zhurnal ksperimental'noi i Teoreticheskoi Fiziki
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