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Pis'ma v Zh. Èksper. Teoret. Fiz., 2002, Volume 76, Issue 6, Pages 415–419 (Mi jetpl2927)  

CONDENSED MATTER

Mobility of electrons on a liquid-helium film with a rough substrate

V. B. Shikin

Institute of Solid State Physics, Russian Academy of Sciences

Abstract: The origin of the specific activation-type behavior of the mobility of electrons on liquid-helium films with different kinds of substrates is discussed. The characteristic feature of the activation energy $E_a$ observed in the experiment is its dependence on the effective film thickness $d$ in the form $E_a\propto d^{-2}$. A scenario of this effect is proposed with consideration for the roughness of the substrate underlying the liquid-helium film.

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English version:
Journal of Experimental and Theoretical Physics Letters, 2002, 76:6, 355–359

Document Type: Article
PACS: 67.70.+n, 72.60.+g, 73.50.-h
Received: 20.06.2002
Revised: 19.07.2002

Citation: V. B. Shikin, “Mobility of electrons on a liquid-helium film with a rough substrate”, Pis'ma v Zh. Èksper. Teoret. Fiz., 76:6 (2002), 415–419; JETP Letters, 76:6 (2002), 355–359

Citation in format AMSBIB
\Bibitem{Shi02}
\by V.~B.~Shikin
\paper Mobility of electrons on a liquid-helium film with a rough substrate
\jour Pis'ma v Zh. \`Eksper. Teoret. Fiz.
\yr 2002
\vol 76
\issue 6
\pages 415--419
\mathnet{http://mi.mathnet.ru/jetpl2927}
\transl
\jour JETP Letters
\yr 2002
\vol 76
\issue 6
\pages 355--359
\crossref{https://doi.org/10.1134/1.1525036}
\scopus{http://www.scopus.com/record/display.url?origin=inward&eid=2-s2.0-0039484299}


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