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Pis'ma v Zh. Èksper. Teoret. Fiz., 2016, Volume 103, Issue 11, Pages 816–821 (Mi jetpl4960)  

This article is cited in 4 scientific papers (total in 4 papers)

MISCELLANEOUS

Generation of X rays at the grazing incidence of 18-MeV electrons on a thin Si crystal in a betatron chamber

M. M. Rychkov, V. V. Kaplin, K. V. Sukharnikov, I. K. Vas'kovskii

National Research Tomsk Polytechnic University

Abstract: The generation of X rays at the grazing incidence of 18-MeV electrons with a 50-$\mu$m-thick Si crystal 4 mm in length along the electron beam has been studied. The crystal has been placed in a goniometer inside the chamber of a B-18 betatron. The results exhibit strong changes in the angular distribution of bremsstrahlung at the variation of the orientation of the crystal. This effect is not observed in the case of the normal incidence of electrons on the surface of a thin crystal where the channeling of electrons, which occurs at certain orientation of the crystal, is absent. Images of a reference microstructure have been obtained with a high resolution of details of the microstructure owing to the smallness of the source of radiation. The dependence of the contrast of an image on the position of the microstructure in the radiation cone has been demonstrated.

Funding Agency Grant Number
Национальный исследовательский Томский политехнический университет 66-2014


DOI: https://doi.org/10.7868/S0370274X16110126

Full text: PDF file (1241 kB)
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English version:
Journal of Experimental and Theoretical Physics Letters, 2016, 103:11, 723–727

Bibliographic databases:

Received: 22.04.2016

Citation: M. M. Rychkov, V. V. Kaplin, K. V. Sukharnikov, I. K. Vas'kovskii, “Generation of X rays at the grazing incidence of 18-MeV electrons on a thin Si crystal in a betatron chamber”, Pis'ma v Zh. Èksper. Teoret. Fiz., 103:11 (2016), 816–821; JETP Letters, 103:11 (2016), 723–727

Citation in format AMSBIB
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\paper Generation of X rays at the grazing incidence of 18-MeV electrons on a thin Si crystal in a betatron chamber
\jour Pis'ma v Zh. \`Eksper. Teoret. Fiz.
\yr 2016
\vol 103
\issue 11
\pages 816--821
\mathnet{http://mi.mathnet.ru/jetpl4960}
\crossref{https://doi.org/10.7868/S0370274X16110126}
\elib{http://elibrary.ru/item.asp?id=26427025}
\transl
\jour JETP Letters
\yr 2016
\vol 103
\issue 11
\pages 723--727
\crossref{https://doi.org/10.1134/S0021364016110114}
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    This publication is cited in the following articles:
    1. A. V. Serov, A. V. Koltsov, I. A. Mamonov, J. Surf. Ingestig., 11:5 (2017), 987–993  crossref  isi  scopus
    2. M. M. Rychkov, V. V. Kaplin, E. L. Malikov, V. A. Smolyanskiy, I. B. Stepanov, A. S. Lutsenko, V. Gentsel'man, I. K. Vas'kovskii, International Conference on Innovations in Non-Destructive Testing (Sibtest), Journal of Physics Conference Series, 881, IOP Publishing Ltd, 2017, UNSP 012007  crossref  isi  scopus
    3. M. M. Rychkov, V. V. Kaplin, E. L. Malikov, V. A. Smolyanskii, V. Gentsel'man, I. K. Vas'kovskii, J. Nondestruct. Eval., 37:1 (2018), 13  crossref  isi  scopus
    4. M. M. Rychkov, V. V. Kaplin, E. L. Malikov, V. A. Smolyanskiy, I. B. Stepanov, A. S. Lutsenko, V. Gentsel'man, I. K. Vas'kovskiy, 6th International Conference: Modern Technologies For Non-Destructive Testing, IOP Conference Series-Materials Science and Engineering, 289, IOP Publishing Ltd, 2018, UNSP 012044  crossref  isi  scopus
  • Письма в Журнал экспериментальной и теоретической физики Pis'ma v Zhurnal Иksperimental'noi i Teoreticheskoi Fiziki
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