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Pis'ma v Zh. Èksper. Teoret. Fiz., 2016, Volume 104, Issue 5, Pages 334–335 (Mi jetpl5056)  

CONDENSED MATTER

Transport of electrons on liquid helium in a microchannel device near the current threshold

N. R. Beysengulovab, D. G. Reesbc, D. A. Tayurskiiab, K. Konoabc

a KFU-RIKEN Joint Research Laboratory, Institute of Physics, Kazan Federal University, 420008 Kazan, Russia
b RIKEN CEMS, 351-0198 Wako, Japan
c NCTU-RIKEN Joint Research Laboratory, Institute of Physics, National Chiao Tung University, 300 Hsinchu, Taiwan

Abstract: We study the transport of strongly interacting electrons on the surface of liquid helium confined in a microchannel geometry, near the current threshold point. The current threshold depends on the electrostatic confinement, created by the microchannel electrodes, and on the electrostatic potential of electron system. Depending on the geometry of the microchannel, the current pinch-off can occur at the center or move to the edges of the microchannel, as confirmed by Finite Element Model calculations. The confining potential dependence of electron conductivity above the current threshold point is consistent with a classical charge continuum model. However, we find that below the threshold point electron transport is suppressed due to charging energy effects.

DOI: https://doi.org/10.7868/S0370274X16170082

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English version:
Journal of Experimental and Theoretical Physics Letters, 2016, 104:5, 323–328

Bibliographic databases:

Document Type: Article
Received: 25.07.2016
Language: English

Citation: N. R. Beysengulov, D. G. Rees, D. A. Tayurskii, K. Kono, “Transport of electrons on liquid helium in a microchannel device near the current threshold”, Pis'ma v Zh. Èksper. Teoret. Fiz., 104:5 (2016), 334–335; JETP Letters, 104:5 (2016), 323–328

Citation in format AMSBIB
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\paper Transport of electrons on liquid helium in a microchannel device near the current threshold
\jour Pis'ma v Zh. \`Eksper. Teoret. Fiz.
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\vol 104
\issue 5
\pages 334--335
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\crossref{https://doi.org/10.7868/S0370274X16170082}
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\jour JETP Letters
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\crossref{https://doi.org/10.1134/S002136401617001X}
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