Nanosystems: Physics, Chemistry, Mathematics
 RUS  ENG JOURNALS   PEOPLE   ORGANISATIONS   CONFERENCES   SEMINARS   VIDEO LIBRARY   PACKAGE AMSBIB
 General information Latest issue Archive Search papers Search references RSS Latest issue Current issues Archive issues What is RSS

 Nanosystems: Physics, Chemistry, Mathematics: Year: Volume: Issue: Page: Find

 Nanosystems: Physics, Chemistry, Mathematics, 2017, Volume 8, Issue 6, Pages 809–815 (Mi nano107)

CHEMISTRY AND MATERIAL SCIENCE

Fractal analysis – a surrogate technique for material characterization

M. S. Swapna, S. Sankararaman

Department of Optoelectronics and Department of Nanoscience and Nanotechnology, University of Kerala, Trivandrum, Kerala, 695581, India

Abstract: Fractal analysis has emerged as a potential analytical tool in almost all branches of science and technology. The paper is the first report of using fractal dimension as a surrogate technique for estimating particle size. A regression equation is set connecting the soot particle size and fractal dimension, after investigating the Field Emission Scanning Electron Microscopic (FESEM) images of carbonaceous soot from five different sources. Since the fractal dimension is an invariant property under the scale transformation, an ordinary photograph of the soot should also yield the same fractal dimension. This enables one to determine the average size of the soot particles, using the regression equation, by calculating the fractal dimension from the photograph. Hence, instead of frequent measurement of average particle size from FESEM, this technique of estimating the particle size from the fractal dimension of the soot photograph, is found to be a potentially cost-effective and non-contact method.

Keywords: fractals, FESEM, carbon nanoparticles, particle size, box-counting.

DOI: https://doi.org/10.17586/2220-8054-2017-8-6-809-815

Full text: PDF file (3118 kB)
Full text: http://nanojournal.ifmo.ru/en/articles-2/volume8/8-6/chemistry/paper15/

Bibliographic databases:

PACS: 81.05 U, 05.45.Df, 61.48.De, 81.20.Ka
Revised: 26.10.2017
Language:

Citation: M. S. Swapna, S. Sankararaman, “Fractal analysis – a surrogate technique for material characterization”, Nanosystems: Physics, Chemistry, Mathematics, 8:6 (2017), 809–815

Citation in format AMSBIB
\Bibitem{SwaSan17} \by M.~S.~Swapna, S.~Sankararaman \paper Fractal analysis -- a surrogate technique for material characterization \jour Nanosystems: Physics, Chemistry, Mathematics \yr 2017 \vol 8 \issue 6 \pages 809--815 \mathnet{http://mi.mathnet.ru/nano107} \crossref{https://doi.org/10.17586/2220-8054-2017-8-6-809-815} \isi{http://gateway.isiknowledge.com/gateway/Gateway.cgi?GWVersion=2&SrcApp=PARTNER_APP&SrcAuth=LinksAMR&DestLinkType=FullRecord&DestApp=ALL_WOS&KeyUT=000419787600015}