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Kvantovaya Elektronika, 2007, Volume 37, Number 6, Pages 575–579 (Mi qe13485)  

This article is cited in 3 scientific papers (total in 3 papers)

Fiber and integrated optics

Defects of a phosphosilicate glass exposed to the 193-nm radiation

Yu. V. Larionov, V. O. Sokolov, V. G. Plotnichenko

Fiber Optics Research Center of the Russian Academy of Sciences, Moscow

Abstract: Induced absorption is measured in a hydrogen-unloaded phosphosilicate glass (PSG) in spectral ranges from 140 to 850 nm and from 1000 to 1700 nm before and after its exposure to the 193-nm radiation. It is shown that the induced-absorption bands in the range between 140 and 300 nm do not coincide with the bands observed earlier after exposing a PSG to X-rays. It is assumed that the photorefractive effect in the PSG is related to variations induced in the glass network rather than to defects responsible for the induced-absorption bands.

Full text: PDF file (131 kB)

English version:
Quantum Electronics, 2007, 37:6, 575–579

Bibliographic databases:

PACS: 42.81.Cn, 79.20.Ds, 61.80.Ba
Received: 22.10.2006

Citation: Yu. V. Larionov, V. O. Sokolov, V. G. Plotnichenko, “Defects of a phosphosilicate glass exposed to the 193-nm radiation”, Kvantovaya Elektronika, 37:6 (2007), 575–579 [Quantum Electron., 37:6 (2007), 575–579]

Linking options:
  • http://mi.mathnet.ru/eng/qe13485
  • http://mi.mathnet.ru/eng/qe/v37/i6/p575

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    Citing articles on Google Scholar: Russian citations, English citations
    Related articles on Google Scholar: Russian articles, English articles

    This publication is cited in the following articles:
    1. Yu V Larionov, V O Sokolov, V G Plotnichenko, QUANTUM ELECTRON, 38:10 (2008), 945  mathnet  crossref  adsnasa  isi  elib  scopus
    2. Quantum Electron., 40:9 (2010), 804–810  mathnet  crossref  adsnasa  isi  elib
    3. Quantum Electron., 40:3 (2010), 264–268  mathnet  crossref  adsnasa  elib
  • Квантовая электроника Quantum Electronics
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