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Kvantovaya Elektronika, 2014, Volume 44, Number 12, Pages 1173–1178 (Mi qe16082)  

This article is cited in 4 scientific papers (total in 4 papers)

Laser applications and other topics in quantum electronics

Correlation of the ionisation response at selected points of IC sensitive regions with SEE sensitivity parameters under pulsed laser irradiation

A. V. Gordienko, O. B. Mavritskii, A. N. Egorov, A. A. Pechenkin, D. V. Savchenkov

National Engineering Physics Institute "MEPhI", Moscow

Abstract: The statistics of the ionisation response amplitude measured at selected points and their surroundings within sensitive regions of integrated circuits (ICs) under focused femtosecond laser irradiation is obtained for samples chosen from large batches of two types of ICs. A correlation between these data and the results of full-chip scanning is found for each type. The criteria for express validation of IC single-event effect (SEE) hardness based on ionisation response measurements at selected points are discussed.

Keywords: single event effects, femtosecond laser pulses, ionisation response.

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English version:
Quantum Electronics, 2014, 44:12, 1173–1178

Bibliographic databases:

PACS: 42.62.-b, 82.53.Mj
Received: 07.04.2014
Revised: 04.06.2014

Citation: A. V. Gordienko, O. B. Mavritskii, A. N. Egorov, A. A. Pechenkin, D. V. Savchenkov, “Correlation of the ionisation response at selected points of IC sensitive regions with SEE sensitivity parameters under pulsed laser irradiation”, Kvantovaya Elektronika, 44:12 (2014), 1173–1178 [Quantum Electron., 44:12 (2014), 1173–1178]

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  • http://mi.mathnet.ru/eng/qe16082
  • http://mi.mathnet.ru/eng/qe/v44/i12/p1173

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    Citing articles on Google Scholar: Russian citations, English citations
    Related articles on Google Scholar: Russian articles, English articles

    This publication is cited in the following articles:
    1. Gordienko A.V., Mavritskii O.B., Egorov A.N., Pechenkin A.A., Savchenkov D.V., Frontiers in Ultrafast Optics: Biomedical, Scientific, and Industrial Applications Xv, Proceedings of Spie, 9355, eds. Heisterkamp A., Herman P., Meunier M., Nolte S., Spie-Int Soc Optical Engineering, 2015, 93551C  crossref  isi  scopus
    2. Skorobogatov P.K., Davydov G.G., Sogoyan A.V., Nikiforov A.Y., Egorov A.N., 2015 15Th European Conference on Radiation and Its Effects on Components and Systems (Radecs), IEEE, 2015  isi
    3. Mavritskii O.B., Chumakov A.I., Egorov A.N., Pechenkin A.A., Nikiforov A.Yu., Instrum. Exp. Tech., 59:5 (2016), 627–649  crossref  isi  elib  scopus
    4. S. V. Pokrovskii, O. B. Mavritskii, A. N. Egorov, N. A. Mineev, A. A. Timofeev, I. A. Rudnev, III International Conference on Laser and Plasma Researches and Technologies, Journal of Physics Conference Series, 941, IOP Publishing Ltd, 2018, UNSP 012078  crossref  isi  scopus
  • Квантовая электроника Quantum Electronics
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