Kvantovaya Elektronika
RUS  ENG    JOURNALS   PEOPLE   ORGANISATIONS   CONFERENCES   SEMINARS   VIDEO LIBRARY   PACKAGE AMSBIB  
General information
Latest issue
Archive
Impact factor
Guidelines for authors

Search papers
Search references

RSS
Latest issue
Current issues
Archive issues
What is RSS



Kvantovaya Elektronika:
Year:
Volume:
Issue:
Page:
Find






Personal entry:
Login:
Password:
Save password
Enter
Forgotten password?
Register


Kvantovaya Elektronika, 2017, Volume 47, Number 4, Pages 378–384 (Mi qe16599)  

This article is cited in 7 scientific papers (total in 7 papers)

Optical elements

Effect of structural defects of aperiodic multilayer mirrors on the properties of reflected (sub)femtosecond pulses

S. A. Garakhina, E. N. Meltchakovb, V. N. Polkovnikova*, N. N. Salashchenkoa, N. I. Chkhaloa

a Institute for Physics of Microstructures, Russian Academy of Sciences, Nizhnii Novgorod
b Laboratoire Charles Fabry, Institut d'Optique Graduate School, France

Abstract: The effect of structural defects (for example, of interlayer roughness, layer thickness fluctuations and departures of Mo film density from the tabular one) on the amplitude and phase of the complex reflection coefficient as well as on the amplitude and duration of reflected pulses is numerically studied by the example of a model aperiodic Mo/Si multilayer mirror intended for the compression of a chirped pulse with a spectrum lying in a 50 – 80 eV photon energy range. The departures of Mo film density from the tabular values and film thickness fluctuations are shown to exert the strongest effect on the amplitude and duration of the reflected pulses. The interlayer roughness has a comparable effect on the amplitude of the reflection coefficient, but its effect on the duration of reflected pulses is weaker. Even small film thickness fluctuations may give rise to additional reflected pulses of high intensity, which are delayed in time relative to the principal pulse. The Mo-film density in a Mo/Si mirror is shown to vary from 0.77 to 0.97 (in units of the tabular value for massive molybdenum) as the film thickness varies from 1.5 to 5.5 nm. We discuss the key problems that have to be solved in the development of the fabrication technology of multilayer mirrors with desired characteristics.

Keywords: aperiodic multilayer mirror, chirped femtosecond pulse, complex reflection coefficient, genetic algorithm, roughness, Fourier transform.

Funding Agency Grant Number
Russian Academy of Sciences - Federal Agency for Scientific Organizations
Russian Foundation for Basic Research 17-52-150006
Russian Science Foundation 16-42-01034

* Author to whom correspondence should be addressed

Full text: PDF file (1095 kB)
References: PDF file   HTML file

Materials:
pic_10.pdf 374.1 Kb
pic_6.pdf 289.4 Kb


English version:
Quantum Electronics, 2017, 47:4, 378–384

Bibliographic databases:

Received: 03.03.2017

Citation: S. A. Garakhin, E. N. Meltchakov, V. N. Polkovnikov, N. N. Salashchenko, N. I. Chkhalo, “Effect of structural defects of aperiodic multilayer mirrors on the properties of reflected (sub)femtosecond pulses”, Kvantovaya Elektronika, 47:4 (2017), 378–384 [Quantum Electron., 47:4 (2017), 378–384]

Linking options:
  • http://mi.mathnet.ru/eng/qe16599
  • http://mi.mathnet.ru/eng/qe/v47/i4/p378

    SHARE: VKontakte.ru FaceBook Twitter Mail.ru Livejournal Memori.ru


    Citing articles on Google Scholar: Russian citations, English citations
    Related articles on Google Scholar: Russian articles, English articles

    This publication is cited in the following articles:
    1. Quantum Electron., 49:4 (2019), 380–385  mathnet  crossref  isi  elib
    2. S. A. Garakhin, S. Yu. Zuev, R. S. Pleshkov, V. N. Polkovnikov, N. N. Salashchenko, I N. Chkhalo, J. Surf. Ingestig., 13:2 (2019), 267–271  crossref  isi
    3. Yu. A. Vainer, S. A. Garakhin, V. N. Polkovnikov, N. N. Salashchenko, M. V. Svechnikov, N. I. Chkhalo, P. A. Yunin, J. Surf. Ingestig., 13:1 (2019), 8–13  crossref  isi
    4. V. V. Lider, Phys. Usp., 62:11 (2019), 1063–1095  mathnet  crossref  crossref  adsnasa  isi  elib
    5. V. N. Polkovnikov, N. N. Salashchenko, M. V. Svechnikov, N. I. Chkhalo, Phys. Usp., 63:1 (2020), 83–95  mathnet  crossref  crossref  isi  elib
    6. Quantum Electron., 50:10 (2020), 967–975  mathnet  crossref  isi  elib
    7. S. A. Garakhin, M. M. Barysheva, E. A. Vishnyakov, S. Yu. Zuev, A. S. Kirichenko, S. V. Kuzin, V. N. Polkovnikov, N. N. Salashchenko, M. V. Svechnikov, N. I. Chkhalo, Tech. Phys., 65:11 (2020), 1792–1799  crossref  isi
  • Квантовая электроника Quantum Electronics
    Number of views:
    This page:391
    Full text:27
    References:21
    First page:11

     
    Contact us:
     Terms of Use  Registration to the website  Logotypes © Steklov Mathematical Institute RAS, 2021