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Kvantovaya Elektronika, 2018, Volume 48, Number 9, Pages 854–855 (Mi qe16885)  

Integrated optics

Planar waveguide structures based on SrF2 : Ho, Er, Tm. Dependence of the refractive index on the dopant concentration

A. Ya. Karasik*, V. A. Konyushkin, A. N. Nakladov, D. S. Chunaev

A.M. Prokhorov General Physics Institute Russian Academy of Sciences, Moscow

Abstract: Refractive indices of SrF2 crystals doped with holmium, erbium, and thulium ions are measured. These crystals are used as active laser media, in particular, as materials for planar waveguides. The presence of active ions in these crystals may create a difference between the refractive indices of the cladding and the doped core of a planar waveguide. At dopant concentration to 4%, the difference Δn between the refractive indices of the doped core and undoped reflective layer can reach 0.007.

Keywords: strontium fluoride, refractive indices.

Funding Agency Grant Number
Russian Academy of Sciences - Federal Agency for Scientific Organizations 1.25П
Russian Foundation for Basic Research 16-02-00338

* Author to whom correspondence should be addressed

Full text: PDF file (296 kB)
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English version:
Quantum Electronics, 2018, 48:9, 854–855

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Received: 15.12.2017

Citation: A. Ya. Karasik, V. A. Konyushkin, A. N. Nakladov, D. S. Chunaev, “Planar waveguide structures based on SrF2 : Ho, Er, Tm. Dependence of the refractive index on the dopant concentration”, Kvantovaya Elektronika, 48:9 (2018), 854–855 [Quantum Electron., 48:9 (2018), 854–855]

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