Planar waveguide structures based on SrF2 : Ho, Er, Tm. Dependence of the refractive index on the dopant concentration
A. Ya. Karasik*, V. A. Konyushkin, A. N. Nakladov, D. S. Chunaev
A.M. Prokhorov General Physics Institute Russian Academy of Sciences, Moscow
Refractive indices of SrF2 crystals doped with holmium, erbium, and thulium ions are measured. These crystals are used as active laser media, in particular, as materials for planar waveguides. The presence of active ions in these crystals may create a difference between the refractive indices of the cladding and the doped core of a planar waveguide. At dopant concentration to 4%, the difference Δn between the refractive indices of the doped core and undoped reflective layer can reach 0.007.
strontium fluoride, refractive indices.
* Author to whom correspondence should be addressed
PDF file (296 kB)
Quantum Electronics, 2018, 48:9, 854–855
A. Ya. Karasik, V. A. Konyushkin, A. N. Nakladov, D. S. Chunaev, “Planar waveguide structures based on SrF2 : Ho, Er, Tm. Dependence of the refractive index on the dopant concentration”, Kvantovaya Elektronika, 48:9 (2018), 854–855 [Quantum Electron., 48:9 (2018), 854–855]
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