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Kvantovaya Elektronika, 1996, Volume 23, Number 8, Pages 762–764 (Mi qe768)  

Laser applications and other topics in quantum electronics

The use of phase matching as the null method for scanning bulk deformation fields in semiconductor materials

S. L. Musher, M. F. Stupak, V. S. Syskin

Institute of Automation and Electrometry, Siberian Branch of Russian Academy of Sciences, Novosibirsk

Abstract: A high polarisation sensitivity of the phase matching in nonlinear crystals was utilised in fast scanning of bulk deformation fields in semiconductor substrates and films.

Full text: PDF file (198 kB)

English version:
Quantum Electronics, 1996, 26:8, 743–745

Bibliographic databases:

PACS: 62.20.Fe, 42.62.Eh
Received: 01.01.1996

Citation: S. L. Musher, M. F. Stupak, V. S. Syskin, “The use of phase matching as the null method for scanning bulk deformation fields in semiconductor materials”, Kvantovaya Elektronika, 23:8 (1996), 762–764 [Quantum Electron., 26:8 (1996), 743–745]

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  • http://mi.mathnet.ru/eng/qe/v23/i8/p762

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