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UFN, 2003, Volume 173, Number 5, Pages 465–490 (Mi ufn2135)  

This article is cited in 37 scientific papers (total in 37 papers)


Nonequilibrium 1/f γ noise in conducting films and contacts

G. P. Zhigal'skii

Moscow State Institute of Electronic Engineering

Abstract: Work on nonequilibrium flicker-noise (1/f γ noise or NEFN) in conducting films of various materials and in thin-film contacts is reviewed. Experimental methods for studying nonequilibrium flicker fluctuations by separating NEFN from the total noise are suggested. Published results on NEFN in metal and alloy films, Ni/Cr-film and TaxNy-film resistors, and contacts are systematized. It is shown that various kinds of NEFN occur in conducting films. Depending on test conditions, external influences, and the film microstructure, both stationary and non-stationary NEFNs are observed. The use of 1/f γ noise measurements for nondestructively controlling the quality of thin-film conductors is substantiated. For most of the passive IC components (thin-film conductors, resistive layers, contacts), NEFN makes a much more informative quality indicator than equilibrium flicker-noise.


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English version:
Physics–Uspekhi, 2003, 46:5, 449–471

Bibliographic databases:

PACS: 05.40.Ca, 72.70.+m, 73.50.Td, 85.40.Qx
Received: May 15, 2002
Revised: February 17, 2003

Citation: G. P. Zhigal'skii, “Nonequilibrium 1/f γ noise in conducting films and contacts”, UFN, 173:5 (2003), 465–490; Phys. Usp., 46:5 (2003), 449–471

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    This publication is cited in the following articles:
    1. Zhigal'skii G.P., “1/f noise nonlinear effects in metal films and contacts: physics and applications”, Fluctuations and Noise in Materials, SPIE Proceedings Series, 2004, 296–309  crossref  adsnasa  isi  scopus
    2. Vitusevich S.A., Danylyuk S.V., Klein N., Petrychuk M.V., Belyaev A.E., “Power and temperature dependence of low frequency noise in AlGaN/GaN transmission line model structures”, Journal of Applied Physics, 96:10 (2004), 5625–5630  crossref  adsnasa  isi  scopus
    3. Vitusevich S.A., Danylyuk S.V., Petrychuk M.V., Antoniuk O.A., Klein N., Belyaev A.E., “Equilibrium and non-equilibrium 1/f noise in AlGaN/GaN TLM structures”, Applied Surface Science, 238:1–4 (2004), 143–146  crossref  adsnasa  isi  scopus
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    5. Zhigal'skii G.P., Bespalov V.A., Gorbatsevich A.A., Il'ichev E.A., Shmelev S.S., Andrushchenko S.A., Rodin M.S., “Effect of deep trapping levels on the excess noise in GaAs high-energy particle detectors”, Journal of Communications Technology and Electronics, 50:6 (2005), 667–672  isi
    6. Zhigal'skii G.P., “Nondestructive quality control of integrated circuits by electrical noise and nonlinearity characteristics”, Journal of Communications Technology and Electronics, 50:5 (2005), 477–502  isi
    7. Rumyantsev S.L., Levinshtein M.E., Gurevich S.A., Kozhevin V.M., Yavsin D.A., Shur M.S., Pala N., Khanna A., “Low-frequency noise in monodisperse platinum nanostructures near the percolation threshold”, Physics of the Solid State, 48:11 (2006), 2194–2198  crossref  adsnasa  isi  scopus
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    16. Zhigal'skii G.P., “Excess noise and nonlinear effects in low-dimensional conductors”, Journal of Communications Technology and Electronics, 55:3 (2010), 241–255  crossref  isi  scopus
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    26. Shmidt N., Greshnov A., Chernyakov A., Levinshtein M., Zakgeim A., Shabunina E., “Mechanisms Behind Efficiency Droop and Degradation in Ingan/Gan Leds”, Physica Status Solidi C: Current Topics in Solid State Physics, Vol 10, No 3, Physica Status Solidi C-Current Topics in Solid State Physics, 10, no. 3, eds. Toropov A., Ivanov S., 2013, 332–334  crossref  isi  scopus
    27. O. V. Gerashchenko, V. A. Matveev, N. K. Pleshanov, V. Yu. Bairamukov, “Electrical resistance and 1/f fluctuations in thin titanium films”, Phys. Solid State, 56:7 (2014), 1438  crossref  isi  elib  scopus
    28. A. Z. Kolodiy, Z. A. Kolodiy, “Quantitative assessment of noise signal information”, Aut. Control Comp. Sci, 48:4 (2014), 243  crossref  elib  scopus
    29. Chernyakov A.E., Levinshtein E., Talnishnikh N.A., Shabunina E.I., Shmidt N.M., “Low-Frequency Noise in Diagnostics of Power Blue Ingan/Gan Leds”, J. Cryst. Growth, 401 (2014), 302–304  crossref  isi  elib  scopus
    30. G. P. Zhigal’skii, T. A. Kholomina, “Excess noise and deep levels in GaAs detectors of nuclear particles and ionizing radiation”, J. Commun. Technol. Electron, 60:6 (2015), 517  crossref  isi  scopus
    31. Yu. E. Kuzovlev, “Why nature needs 1/f noise”, Phys. Usp., 58:7 (2015), 719–729  mathnet  crossref  crossref  adsnasa  isi  elib  elib
    32. Janahmadov A.Kh., “Flicker Noise Spectroscopy (FNS) of Dynamics Signals and Its Application in Wear of Oil-Field Compressor Units (OFCU)”: Janahmadov, AK Javadov, MY, Synergetics and Fractals in Tribology, Materials Forming, Machining and Tribology, Springer Int Publishing Ag, 2016, 333–381  crossref  isi
    33. Chernyakov A.E., Kartashova A.P., Shmidt N.M., Shabunina E.I., Talnishnikh N.A., Zakgeim A.L., “Criteria of Unpredictable Failure For High-Power Ingan Leds”, 2016 17Th International Conference on Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and Microsystems (Eurosime), IEEE, 2016  isi
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    35. Gorban I.I., “Methodology and Results From Investigation of the Statistical Stability of Processes”: Gorban, II, Randomness and Hyper-Randomness, Mathematical Engineering, Springer-Verlag Berlin, 2018, 91–112  crossref  isi  scopus
    36. Kolodiy Z.A., Stadnyk B.I., Yatsyshyn S.P., Kolodiy A.Z., “Energy Spectrum of Stochastic Signals Caused By Variations of Electrical Resistance”, Autom. Control Comp. Sci., 52:4 (2018), 311–316  crossref  isi  scopus
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