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Zh. Vychisl. Mat. Mat. Fiz., 2017, Volume 57, Number 5, Pages 867–875 (Mi zvmmf10576)  

This article is cited in 4 scientific papers (total in 4 papers)

Algorithms for solving inverse problems in the optics of layered media based on comparing the extrema of spectral characteristics

T. F. Isaeva, D. V. Luk'yanenkoa, A. V. Tikhonravovb, A. G. Yagolaa

a Faculty of Physics, Moscow State University, Moscow, Russia
b Research Computer Center, Moscow State University, Moscow, Russia

Abstract: A new algorithm for determining the optical parameters of deposited multilayer optical coatings based on comparing the positions of the extrema of the optical characteristics of multilayer optical coatings is proposed. Two versions of this algorithm are compared. Using a series of numerical simulation experiments, the advantage of one of these versions is demonstrated. It is shown that this version decreases the influence of systematic errors in the spectral data.

Key words: inverse problems of optics, spectral characteristics, computational algorithm.

Funding Agency Grant Number
Russian Science Foundation 16-11-10219


DOI: https://doi.org/10.7868/S0044466917050027

Full text: PDF file (618 kB)
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English version:
Computational Mathematics and Mathematical Physics, 2017, 57:5, 867–875

Bibliographic databases:

UDC: 519.634
Received: 24.10.2016

Citation: T. F. Isaev, D. V. Luk'yanenko, A. V. Tikhonravov, A. G. Yagola, “Algorithms for solving inverse problems in the optics of layered media based on comparing the extrema of spectral characteristics”, Zh. Vychisl. Mat. Mat. Fiz., 57:5 (2017), 867–875; Comput. Math. Math. Phys., 57:5 (2017), 867–875

Citation in format AMSBIB
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    Citing articles on Google Scholar: Russian citations, English citations
    Related articles on Google Scholar: Russian articles, English articles

    This publication is cited in the following articles:
    1. T. F. Isaev, I. V. Kochikov, D. V. Lukyanenko, A. V. Tikhonravov, A. G. Yagola, “Improving the accuracy of broad-band monitoring of optical coating deposition”, Mosc. Univ. Phys. Bull., 73:4 (2018), 382–387  crossref  mathscinet  isi  scopus
    2. T. F. Isaev, I. V. Kochikov, D. V. Lukyanenko, A. V. Tikhonravov, A. G. Yagola, “Regularizing algorithms for the determination of thickness of deposited layers in optical coating production”, Eurasian J. Math. Comput. Appl., 6:4 (2018), 38–47  crossref  mathscinet  isi  scopus
    3. M. V. Davidovich, I. A. Kornev, “Opticheskie, IK- i TGts-ekrany na osnove sloistykh struktur metallЦdielektrikЦpoluprovodnik”, Kompyuternaya optika, 43:5 (2019), 765–772  mathnet  crossref
    4. I. V. Kochikov, Yu. S. Lagutin, A. A. Lagutina, D. V. Lukyanenko, A. V. Tikhonravov, A. G. Yagola, “Raising the accuracy of monitoring the optical coating deposition by application of a nonlocal algorithm of data analysis”, J. Appl. Industr. Math., 14:2 (2020), 329–338  mathnet  crossref  crossref  elib
  • ∆урнал вычислительной математики и математической физики Computational Mathematics and Mathematical Physics
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