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Zh. Vychisl. Mat. Mat. Fiz., 2012, Volume 52, Number 1, Pages 133–143 (Mi zvmmf9643)  

Measurement of the emitter field in the presence of an external source

V. P. Ivanov

Blagonravov Institute of Mechanical Engineering, Russian Academy of Sciences, ul. Bardina 4, Moscow, 119334 Russia

Abstract: A two-layer array antenna is used to measure the field of an emitter in the presence of an external field. The measurement problem is posed as an inverse scattering problem. Specifically, in the course of measurement, the array antenna separates the total field into the external field and the outgoing fields scattered by the emitter and the antenna plus the field radiated by the emitter. The external field is used to calculate the scattered field at the emitter. The field radiated by the emitter is determined by subtracting the scattered field at the emitter from the total field radiated and scattered by the emitter and the antenna.

Key words: emitter, receiver, array antenna, potential for HelmholtzТs equation, inverse problem, Vandermonde determinant, approximation problem, solution estimation

Full text: PDF file (243 kB)
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English version:
Computational Mathematics and Mathematical Physics, 2012, 52:1, 127–136

Bibliographic databases:

UDC: 519.634
Received: 27.05.2010

Citation: V. P. Ivanov, “Measurement of the emitter field in the presence of an external source”, Zh. Vychisl. Mat. Mat. Fiz., 52:1 (2012), 133–143; Comput. Math. Math. Phys., 52:1 (2012), 127–136

Citation in format AMSBIB
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