We have found exact upper bounds for length of tests detecting the constant inaccuracies at the inputs of the circuits of logical gates. We offered new methods of designing networks convenient to fault diagnostic for which the class of admissible inaccuracies is wider than that is usually supposed and a basis is not restricted except the requirement of functional completingness and the admission that the basis automata must be strongly connected. We showed how to find inaccuracies while we use conditional or unconditional tests. The effectiveness of obtained tests is given: the test lengths are indicated and a diagnostics grade is found. (A diagnostics grade is the level of detailness in the indication of circuit areas containing faulty units.)
Graduated Novosibirsk State University in 1965. Ph.D. thesis was defended in 1975. A list of my works contains more than 50 titles.
Converting circuits of functional elements into easily testable forms // Siberian Advances in Mathematics, 1995, v. 5, no. 1, p. 94–119.
Fault detection in parts of the circuits of functional elements // Discrete Analysis and Operations Research. Dordrecht: Kluwer Academic Publishers, 1995, p. 173–209. (Mathematics and its applications; v. 355.)