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Avtomatika i Telemekhanika, 1990, Issue 8, Pages 156–164 (Mi at5790)  
Technical Diagnostics

Test and functional diagnosis of digital devices with memory by built-in duplication

A. M. Zakaryan

Scientific-Production Center "Armintelsistem", Yerevan
Full-text PDF (1127 kB)

Received: 20.04.1989
Bibliographic databases:
Document Type: Article
UDC: 681.326.7:62-504
Language: Russian
Citation: A. M. Zakaryan, “Test and functional diagnosis of digital devices with memory by built-in duplication”, Avtomat. i Telemekh., 1990, no. 8, 156–164; Autom. Remote Control, 51:8 (1990), 1135–1141
Citation in format AMSBIB
\Bibitem{Zak90}
\by A.~M.~Zakaryan
\paper Test and functional diagnosis of digital devices with memory by built-in duplication
\jour Avtomat. i Telemekh.
\yr 1990
\issue 8
\pages 156--164
\mathnet{http://mi.mathnet.ru/at5790}
\zmath{https://zbmath.org/?q=an:0727.94012}
\transl
\jour Autom. Remote Control
\yr 1990
\vol 51
\issue 8
\pages 1135--1141
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  • https://www.mathnet.ru/eng/at/y1990/i8/p156
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