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Avtomatika i Telemekhanika, 1988, Issue 9, Pages 119–125
(Mi at6759)
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Technical Diagnostics
Design of pseudo-random test sequence generators
V. N. Yarmolik Minsk
Abstract:
A procedure is discussed of designing generators of pseudo-random test sequences for monitoring and diagnosis of digital devices. The specifics in designing such generators for exhaustive testing of VLSI circuits are reported.
Received: 01.04.1987
Citation:
V. N. Yarmolik, “Design of pseudo-random test sequence generators”, Avtomat. i Telemekh., 1988, no. 9, 119–125; Autom. Remote Control, 49:9 (1988), 1204–1209
Linking options:
https://www.mathnet.ru/eng/at6759 https://www.mathnet.ru/eng/at/y1988/i9/p119
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