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Doklady Akademii Nauk SSSR, 1982, Volume 265, Number 4, Pages 871–874 (Mi dan45495)  
CRYSTALLOGRAPHY

Intensity of X-rays scattered by layered structures with short-range factors $S\ge1$, $G\ge1$

B. A. Sakharov, A. S. Naumov, V. A. Drits

Geological Institute, USSR Academy of Sciences, Moscow
Full-text PDF (528 kB)
Presented: B. K. Vaĭnshteĭn
Received: 15.02.1982
Document Type: Article
UDC: 548.73:548.4
Language: Russian
Citation: B. A. Sakharov, A. S. Naumov, V. A. Drits, “Intensity of X-rays scattered by layered structures with short-range factors $S\ge1$, $G\ge1$”, Dokl. Akad. Nauk SSSR, 265:4 (1982), 871–874
Citation in format AMSBIB
\Bibitem{SakNauDri82}
\by B.~A.~Sakharov, A.~S.~Naumov, V.~A.~Drits
\paper Intensity of X-rays scattered by layered structures with short-range factors
$S\ge1$, $G\ge1$
\jour Dokl. Akad. Nauk SSSR
\yr 1982
\vol 265
\issue 4
\pages 871--874
\mathnet{http://mi.mathnet.ru/dan45495}
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