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Doklady Akademii Nauk SSSR, 1988, Volume 301, Number 4, Pages 849–851 (Mi dan48354)  
PHYSICS

Semiconductor structure investigation by the methods of acoustic and electron thermoacoustic microscopy

Yu. V. Gulyaev, M. A. Kulakov, A. I. Morosov, E. I. Rau

Institute of Radio Engineering and Electronics, Academy of Sciences of the USSR, Moscow
Full-text PDF (906 kB)
Received: 28.04.1987
Document Type: Article
UDC: 621.385.833:534.6.88
Language: Russian
Citation: Yu. V. Gulyaev, M. A. Kulakov, A. I. Morosov, E. I. Rau, “Semiconductor structure investigation by the methods of acoustic and electron thermoacoustic microscopy”, Dokl. Akad. Nauk SSSR, 301:4 (1988), 849–851
Citation in format AMSBIB
\Bibitem{GulKulMor88}
\by Yu.~V.~Gulyaev, M.~A.~Kulakov, A.~I.~Morosov, E.~I.~Rau
\paper Semiconductor structure investigation by the methods of acoustic and electron thermoacoustic microscopy
\jour Dokl. Akad. Nauk SSSR
\yr 1988
\vol 301
\issue 4
\pages 849--851
\mathnet{http://mi.mathnet.ru/dan48354}
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