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Diskretnaya Matematika, 2019, Volume 31, Issue 2, Pages 14–19
DOI: https://doi.org/10.4213/dm1557 (Mi dm1557) 		 
This article is cited in 4 scientific papers (total in 4 papers)

Easily testable circuits in Zhegalkin basis in the case of constant faults of type “1” at gate outputs

Yu. V. Borodinaab

a Keldysh Institute of Applied Mathematics of Russian Academy of Sciences, Moscow
b Bauman Moscow State Technical University
Full-text PDF (358 kB) Citations (4)
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DOI: https://doi.org/10.4213/dm1557
Abstract: We consider Boolean circuits in Zhegalkin basis and describe all Boolean functions that can be implemented by a circuit admitting a complete fault detection test of length $1$ in case of constant faults of type “1” at gate outputs.
Keywords: Boolean circuits, constant faults, fault detection tests, Zhegalkin basis.
Funding agency Grant number
Russian Academy of Sciences - Federal Agency for Scientific Organizations PRAS-18-01
Received: 26.12.2018
English version:
Discrete Mathematics and Applications, 2020, Volume 30, Issue 5, Pages 303–306
DOI: https://doi.org/10.1515/dma-2020-0026
Bibliographic databases:
Document Type: Article
UDC: 519.718.7
Language: Russian
Citation: Yu. V. Borodina, “Easily testable circuits in Zhegalkin basis in the case of constant faults of type “1” at gate outputs”, Diskr. Mat., 31:2 (2019), 14–19; Discrete Math. Appl., 30:5 (2020), 303–306
Citation in format AMSBIB
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    • This publication is cited in the following 4 articles:
    Citing articles in Google Scholar: Russian citations, English citations
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