Fizika Tverdogo Tela
RUS  ENG    JOURNALS   PEOPLE   ORGANISATIONS   CONFERENCES   SEMINARS   VIDEO LIBRARY   PACKAGE AMSBIB  
General information
Latest issue
Archive

Search papers
Search references

RSS
Latest issue
Current issues
Archive issues
What is RSS



Fizika Tverdogo Tela:
Year:
Volume:
Issue:
Page:
Find






Personal entry:
Login:
Password:
Save password
Enter
Forgotten password?
Register


Fizika Tverdogo Tela, 2024, Volume 66, Issue 6, Pages 966–980
DOI: https://doi.org/10.61011/FTT.2024.06.58254.109
(Mi ftt10343)
 

Semiconductors

Threshold effects in the energy spectrum of quasi-two-dimensional electrons of the accumulation layer

A. Ya. Shul'man, D. V. Posvyanskii

Kotelnikov Institute of Radioengineering and Electronics of the Russian Academy of Sciences, Moscow, Russia
DOI: https://doi.org/10.61011/FTT.2024.06.58254.109
Abstract: We consider the problem of determining the threshold values of the electric field $F$ at which new size-quantized subbands appear in the accumulation layer on the surface of an $n$-type semiconductor. The difficulties of such determination in experimental and computational works presented in the literature are discussed. An explanation of the available facts is proposed as a manifestation of the quadratic dependence of the energy $E$ of the shallow level on the depth of the potential well near the appearance threshold. Formulae of threshold dependence $E(F)$ for the case of parabolic conduction band in the bulk of semiconductor are obtained. The possibility of application of the threshold approximation not only to the main, but also to the excited subbands is shown. In the case of non-parabolic conduction band, the threshold character in dependence of the size-quantized level energy on quasimomentum along the surface is considered. Numerical calculations of two-dimensional spectra under the conditions of the appearance of the main subband, the first and the second excited ones have been performed with $n$-InAs parameters and analyzed by means of the derived expressions for the threshold behavior. A method to determine the threshold of a subband appearance from available data in the region above the threshold is proposed. An instability of the self-consistent solution of the system from the Poisson equation and the effective mass equation in the case of the second excited subband is observed and investigated. Arguments are presented in favor of interpreting this instability as evidence of the formation of two-dimensional valence-type subbands with negative mass in the accumulation layer. We discuss a possible connection between the appearance of such a spectrum in the potential well, the deep of which is comparable to the bandgap, and L.V. Keldysh's assumption about the origin of the amphotericity of impurities that create deep levels in the semiconductor bandgap.
Keywords: semiconductors, low-dimensional structures, accumulation layer, two-band Kane model, effective mass equation, threshold phenomena in two-dimensional spectrum.
Received: 26.04.2024
Revised: 26.04.2024
Accepted: 03.05.2024
Bibliographic databases:
Document Type: Article
Language: Russian
Citation: A. Ya. Shul'man, D. V. Posvyanskii, “Threshold effects in the energy spectrum of quasi-two-dimensional electrons of the accumulation layer”, Fizika Tverdogo Tela, 66:6 (2024), 966–980
Citation in format AMSBIB
\Bibitem{ShuPos24}
\by A.~Ya.~Shul'man, D.~V.~Posvyanskii
\paper Threshold effects in the energy spectrum of quasi-two-dimensional electrons of the accumulation layer
\jour Fizika Tverdogo Tela
\yr 2024
\vol 66
\issue 6
\pages 966--980
\mathnet{http://mi.mathnet.ru/ftt10343}
\elib{https://elibrary.ru/item.asp?id=67917445}
Linking options:
  • https://www.mathnet.ru/eng/ftt10343
  • https://www.mathnet.ru/eng/ftt/v66/i6/p966
  • Citing articles in Google Scholar: Russian citations, English citations
    Related articles in Google Scholar: Russian articles, English articles
    Fizika Tverdogo Tela Fizika Tverdogo Tela
    Statistics & downloads:
    Abstract page:52
    Full-text PDF :30
     
      Contact us:
     Terms of Use  Registration to the website  Logotypes © Steklov Mathematical Institute RAS, 2025