Dispersion of dielectric permittivity and electrical modulus in Ag$_x$HfS$_2$ compounds with a layered structure

According to the impedance spectroscopy data, a significant frequency dispersion of the real and imaginary components of the permittivity was found in the intercalated Ag$_x$HfS$_2$ samples. Using the modular formalism, the dielectric relaxation times were determined, which decrease in magnitude with an increase in the silver content in the samples. Their coincidence with the relaxation times determined from the frequency dependences of the imaginary parts of the complex impedance was shown.