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Semiconductors
Anisotropy of the EPR line shape of dislocation acceptor centers in semiconducting type Ic diamonds
S. N. Samsonenko Donbas National Academy of Civil Engineering and Architecture
Abstract:
The shape anisotropy of the EPR lines of broken carbon bonds in a dislocation core with an edge component in natural semiconducting type Ic diamonds has been investigated. It has been found that electrically active acceptor centers are formed at dislocation steps, jogs, or kinks. The distance between the paramagnetic centers is determined.
Received: 22.07.2013
Citation:
S. N. Samsonenko, “Anisotropy of the EPR line shape of dislocation acceptor centers in semiconducting type Ic diamonds”, Fizika Tverdogo Tela, 56:3 (2014), 431–434; Phys. Solid State, 56:3 (2014), 438–441
Linking options:
https://www.mathnet.ru/eng/ftt11914 https://www.mathnet.ru/eng/ftt/v56/i3/p431
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