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This article is cited in 14 scientific papers (total in 14 papers)
Low dimensional systems
On the influence of the band structure of insulators and image forces on the spectral characteristics of metal-insulator film systems
V. V. Pogosov, A. V. Babich, P. V. Vakula Zaporizhzhya National Technical University
Abstract:
The potential profiles, work functions, and Schottky barriers of aluminum films with the ideal vacuum/Al(111)/SiO$_3$ and vacuum/Al$_2$O$_3$ interfaces and the SiO$_2$/Al(111)/Al$_2$O$_3$ sandwich have been calculated self-consistently with the use of the Kohn-Sham method and the model proposed in our previous work taking into account image forces and the conduction band of the insulator.
Received: 19.03.2013
Citation:
V. V. Pogosov, A. V. Babich, P. V. Vakula, “On the influence of the band structure of insulators and image forces on the spectral characteristics of metal-insulator film systems”, Fizika Tverdogo Tela, 55:10 (2013), 2004–2007; Phys. Solid State, 55:10 (2013), 2120–2123
Linking options:
https://www.mathnet.ru/eng/ftt12584 https://www.mathnet.ru/eng/ftt/v55/i10/p2004
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