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Pis'ma v Zhurnal Èksperimental'noi i Teoreticheskoi Fiziki, 2011, Volume 94, Issue 6, Pages 486–489 (Mi jetpl2030)  
This article is cited in 5 scientific papers (total in 5 papers)

CONDENSED MATTER

Second-harmonic confocal microscopy of layered microstructures based on porous silicon

A. I. Maidykovskii, N. M. Nagorskii, T. V. Murzina, A. A. Nikulin, S. A. Magnitskiy, O. A. Aktsipetrov

M. V. Lomonosov Moscow State University, Faculty of Physics
Full-text PDF (527 kB) Citations (5)
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Abstract: Layered structures based on porous silicon have been studied by confocal microscopy of the second optical harmonic. A linear increase in the second-harmonic intensity with increasing porosity of the layers has been observed. This behavior may result from spatial fluctuations in the dipole quadratic response of the pore walls.
Received: 17.06.2011
Revised: 01.08.2011
English version:
Journal of Experimental and Theoretical Physics Letters, 2011, Volume 94, Issue 6, Pages 451–454
DOI: https://doi.org/10.1134/S0021364011180081
Bibliographic databases:
Document Type: Article
Language: Russian
Citation: A. I. Maidykovskii, N. M. Nagorskii, T. V. Murzina, A. A. Nikulin, S. A. Magnitskiy, O. A. Aktsipetrov, “Second-harmonic confocal microscopy of layered microstructures based on porous silicon”, Pis'ma v Zh. Èksper. Teoret. Fiz., 94:6 (2011), 486–489; JETP Letters, 94:6 (2011), 451–454
Citation in format AMSBIB
\Bibitem{MaiNagMur11}
\by A.~I.~Maidykovskii, N.~M.~Nagorskii, T.~V.~Murzina, A.~A.~Nikulin, S.~A.~Magnitskiy, O.~A.~Aktsipetrov
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\yr 2011
\vol 94
\issue 6
\pages 486--489
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\jour JETP Letters
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\vol 94
\issue 6
\pages 451--454
\crossref{https://doi.org/10.1134/S0021364011180081}
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    • This publication is cited in the following 5 articles:
    Citing articles in Google Scholar: Russian citations, English citations
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