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Pis'ma v Zhurnal Èksperimental'noi i Teoreticheskoi Fiziki, 2017, Volume 106, Issue 12, Pages 789–793
DOI: https://doi.org/10.7868/S0370274X17240134 (Mi jetpl5456) 		 
This article is cited in 3 scientific papers (total in 3 papers)

MISCELLANEOUS

Fast and ultrafast energy-dispersive X-ray reflectrometry based on prism optics

A. G. Tur'yanskiia, S. S. Gizhaab, O. V. Konovalovc

a Lebedev Physical Institute, Russian Academy of Sciences, Moscow, Russia
b RUDN University, Moscow, Russia
c European Synchrotron Radiation Facility (ESRF), Grenoble, France
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DOI: https://doi.org/10.7868/S0370274X17240134
Abstract: Interference spectra of X-ray reflection from thin films have been obtained for the first time by the decomposition of the spectrum of a polychromatic beam by means of a diamond prism. The measurements of film nanostructures and reference absorption spectra have been performed at the ESRF synchrotron. The proposed spectrometric scheme allows obtaining the interference pattern in a wide range of the scattering vector length $q$ without angular scanning. This makes it possible to study ultrafast processes in layered nanostructures at an intense external action of laser pulses or charged particles with a time resolution of about the duration of an X-ray pulse.
Funding agency Grant number
Ministry of Education and Science of the Russian Federation
Received: 09.10.2017
Revised: 09.11.2017
English version:
Journal of Experimental and Theoretical Physics Letters, 2017, Volume 106, Issue 12, Pages 828–832
DOI: https://doi.org/10.1134/S0021364017240122
Bibliographic databases:
Document Type: Article
Language: Russian
Citation: A. G. Tur'yanskii, S. S. Gizha, O. V. Konovalov, “Fast and ultrafast energy-dispersive X-ray reflectrometry based on prism optics”, Pis'ma v Zh. Èksper. Teoret. Fiz., 106:12 (2017), 789–793; JETP Letters, 106:12 (2017), 828–832
Citation in format AMSBIB
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    • This publication is cited in the following 3 articles:
    Citing articles in Google Scholar: Russian citations, English citations
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