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Zhurnal Tekhnicheskoi Fiziki, 1985, Volume 55, Issue 7, Pages 1419–1425
(Mi jtf1354)
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MECHANISMS OF THE BREAKDOWN TENSION REDUCTION IN SILICON HIGH-VOLTAGE
MULTI-LAYERED STRUCTURES
V. A. Kuz'min, A. S. Kyuregyan, Yu. G. Sorokin, V. V. Fedorov, O. V. Bogorodsky, T. P. Vorontsova, O. S. Zhgutova, V. A. Zlobin, L. A. Kirdyashkina, Yu. M. Loktaev, L. S. Rybachyuk, P. N. Shlygin
Received: 16.04.1984 Revised: 16.07.1984
Citation:
V. A. Kuz'min, A. S. Kyuregyan, Yu. G. Sorokin, V. V. Fedorov, O. V. Bogorodsky, T. P. Vorontsova, O. S. Zhgutova, V. A. Zlobin, L. A. Kirdyashkina, Yu. M. Loktaev, L. S. Rybachyuk, P. N. Shlygin, “MECHANISMS OF THE BREAKDOWN TENSION REDUCTION IN SILICON HIGH-VOLTAGE
MULTI-LAYERED STRUCTURES”, Zhurnal Tekhnicheskoi Fiziki, 55:7 (1985), 1419–1425
Linking options:
https://www.mathnet.ru/eng/jtf1354 https://www.mathnet.ru/eng/jtf/v55/i7/p1419
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