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Zhurnal Tekhnicheskoi Fiziki, 1987, Volume 57, Issue 2, Pages 345–348 (Mi jtf574)  
APPLICATION OF TRICRYSTAL TOPOGRAPHY FOR THE DETECTION AND STUDY OF STRUCTURE DEFECTS IN CRYSTALS

I. A. Nikol'sky, P. V. Petrashen, M. A. Chernov
Full-text PDF (2728 kB)
Received: 20.12.1985
Bibliographic databases:
Document Type: Article
UDC: 548.734
Language: Russian
Citation: I. A. Nikol'sky, P. V. Petrashen, M. A. Chernov, “APPLICATION OF TRICRYSTAL TOPOGRAPHY FOR THE DETECTION AND STUDY OF STRUCTURE DEFECTS IN CRYSTALS”, Zhurnal Tekhnicheskoi Fiziki, 57:2 (1987), 345–348
Citation in format AMSBIB
\Bibitem{NikPetChe87}
\by I.~A.~Nikol'sky, P.~V.~Petrashen, M.~A.~Chernov
\paper APPLICATION OF TRICRYSTAL TOPOGRAPHY FOR THE DETECTION AND STUDY OF
STRUCTURE DEFECTS IN CRYSTALS
\jour Zhurnal Tekhnicheskoi Fiziki
\yr 1987
\vol 57
\issue 2
\pages 345--348
\mathnet{http://mi.mathnet.ru/jtf574}
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