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This article is cited in 3 scientific papers (total in 3 papers)
Experimental instruments and technique
Investigation of power IR (850 nm) light-emitting diodes manufacturing by lift-off technique of AlGaAs–GaAs-heterostructure to carrier-substrate
A. V. Malevskaya, N. A. Kalyuzhnyy, F. Yu. Soldatenkov, R. V. Levin, R. A. Salii, D. A. Malevskii, P. V. Pokrovskii, V. R. Larionov, V. M. Andreev Ioffe Institute, St. Petersburg, St. Petersburg, Russia
Abstract:
Development of lift-off technique of AlGaAs/GaAs-heterostructures, grown by the Metalorganic vapour-phase epitaxy, to GaAs carrier-substrate using silver-containing paste or Au-In compound has been carried out. Forming process of frontal ohmic contact to GaAs $n$-type conductivity based on contact systems Au(Ge)/Ni/Au and Pd/Ge/Au with specific contact resistance (2–5)$\cdot$10$^{-6}$ $\Omega$ $\cdot$ cm$^2$ has been investigated. Analyzed was the influence of heterostructure lift-off technique and forming process of frontal ohmic contact on the IR light-emitting diodes parameters: minimum light-emitting diodes (1 mm$^2$ square) series resistance was 0.16 $\Omega$. Optical power 270 mW at current 1.5 A has been achieved.
Keywords:
AlGaAs/GaAs-heterostructure, light-emitting diode, transfer to carrier-substrate, Au–In- compound, ohmic contacts.
Received: 23.06.2022 Revised: 10.11.2022 Accepted: 11.11.2022
Citation:
A. V. Malevskaya, N. A. Kalyuzhnyy, F. Yu. Soldatenkov, R. V. Levin, R. A. Salii, D. A. Malevskii, P. V. Pokrovskii, V. R. Larionov, V. M. Andreev, “Investigation of power IR (850 nm) light-emitting diodes manufacturing by lift-off technique of AlGaAs–GaAs-heterostructure to carrier-substrate”, Zhurnal Tekhnicheskoi Fiziki, 93:1 (2023), 170–174
Linking options:
https://www.mathnet.ru/eng/jtf6929 https://www.mathnet.ru/eng/jtf/v93/i1/p170
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