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Physical Electronics
Dispersion elements for X-ray mirror spectrometer on a range of 7–30 nm
S. A. Garakhin, A. Ya. Lopatin, A. N. Nechai, A. A. Perekalov, A. E. Pestov, N. N. Salashchenko, N. N. Tsybin, N. I. Chkhalo Institute for Physics of Microstructures, Russian Academy of Sciences, Nizhny Novgorod, Russia
Abstract:
Multilayer interference structures acting as dispersion elements for a mirror spectrometer for a wavelength range of 7–30 nm have been calculated and synthesized. Three elements are implemented: for the range $\lambda$ = 7–12 nm – multilayer structure Mo/B4C (number of periods $N$ = 60, period thickness $d$ = 6.5 nm); for the range $\lambda$ = 11–18 nm – Mo/Be ($N$ = 50; $d$ = 9.83 nm) and for the range $\lambda$ = 17–30 nm – Be/Si/Al ($N$ = 40; $d$ = 18.2 nm). For the entire spectral range, an efficiency of more than 10% was obtained at a wavelength resolution of 0.15–1.0 nm.
Keywords:
SXR and EUV radiation, multilayer X-ray mirrors, laser plasma, spectroscopy.
Received: 28.03.2023 Revised: 28.03.2023 Accepted: 28.03.2023
Citation:
S. A. Garakhin, A. Ya. Lopatin, A. N. Nechai, A. A. Perekalov, A. E. Pestov, N. N. Salashchenko, N. N. Tsybin, N. I. Chkhalo, “Dispersion elements for X-ray mirror spectrometer on a range of 7–30 nm”, Zhurnal Tekhnicheskoi Fiziki, 93:7 (2023), 1002–1008
Linking options:
https://www.mathnet.ru/eng/jtf7041 https://www.mathnet.ru/eng/jtf/v93/i7/p1002
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