The precision movement of upconversion nanoparticles on a surface by using scanning probe microscopy

The possibility of precise movement of YVO$_4$ : Yb, Er nanoparticles was studied in this work. Such nanoparticles exhibit upconversion luminescent properties and can serve as an accurate low-invasive probe of changes in the local parameters of the medium (in particular, temperature). Using an atomic force microscope, the substrate region with upconversion nanoparticles deposited from the solution and accompanying residues of the synthesis products was cleaned. The use of mechanical marks on the substrate made it possible to compare the atomic force and optical confocal images of the surface and to register the luminescence from an individual nanoparticle. Elemental analysis and luminescence spectra unambiguously identify the nanoparticle as YVO$_4$ : Yb, Er.