The use of morphometric variables in the surface topography study of X-ray optical elements

We studied the use of morphometric variables (maximal curvature, minimal curvature, mean curvature, topographic index, etc.) for study of the surface of X-ray optical elements. We performed calculations on digital elevation models of a spherical concave substrates: primordial and smoothed digital elevation models, before and after technological operations (mechanical lapping, axisymmetric surface shape correction, ion beam figuring). We have demonstrated a visual display of weakly expressed topographic inhomogeneities, incl. which are not displayed on the maps of the original digital elevation models. The consideration included the study of both the measured samples and the errors in the formation of the digital elevation model (artifacts from the recording system and from the inhomogeneity of the medium), as well as the features of scale decomposition when using the universal spectral-analytical method.