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Atomic and molecular physics
Comment to the paper by A.I. Tolmachev and L. Forlano “Depemdence of the sputtering yield on the angle of ion incidence on the target surface” (2022, V. 92. Issue 5. P. 660–664)
V. I. Shulga Lomonosov Moscow State University, Skobeltsyn Institute of Nuclear Physics, Moscow, Russia
Abstract:
A criitical analysis of the approach applied by A.I. Tolmachev and L. Forlano (ZhTF, 92 (5), 660 (2022)) to solving the problem of ion sputtering of solids is presented.
Keywords:
sputtering, angular dependence of the sputtering yield, computer simulation, program PAOLA, program SRIM, transport equation, binary collisions.
Received: 10.06.2023 Revised: 10.06.2023 Accepted: 14.08.2023
Citation:
V. I. Shulga, “Comment to the paper by A.I. Tolmachev and L. Forlano “Depemdence of the sputtering yield on the angle of ion incidence on the target surface” (2022, V. 92. Issue 5. P. 660–664)”, Zhurnal Tekhnicheskoi Fiziki, 93:10 (2023), 1401–1402
Linking options:
https://www.mathnet.ru/eng/jtf7103 https://www.mathnet.ru/eng/jtf/v93/i10/p1401
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