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Solid-State Electronics
Silicon differential photodetectors. Technology, characteristics, application
V. V. Gavrushko, A. S. Ionov, O. R. Kadriev, V. A. Lastkin Yaroslav-the-Wise Novgorod State University, Veliky Novgorod, Russia
Abstract:
A silicon-based photodetector containing two identical $n^+$–$p$-photodiodes is described. One of the photodiodes had a wide spectral response with high sensitivity in the ultraviolet region. The sensitivity of the second was reduced in the short-wavelength part of the spectrum by creating additional recombination centers in the near-surface region by implanting As ions. The spectral sensitivity of the differential signal obtained by subtracting photocurrents had a pronounced short-wavelength characteristic. The long-wavelength limit of the spectral range in terms of the $\lambda_{0.5}$ level, depending on the doping dose, was in the range of 0.37–0.47 $\mu$m. The sensitivity maximum corresponded to $\lambda_{\mathrm{max}}$ = 0.32–0.37 $\mu$m. The electrical and noise characteristics of the photodetector are given. The possibility of using differential photodetectors as two-color ones is shown.
Keywords:
photodiode, implantation, differential signal, ultraviolet, two-spectrum photodetector.
Received: 31.03.2023 Revised: 08.06.2023 Accepted: 03.07.2023
Citation:
V. V. Gavrushko, A. S. Ionov, O. R. Kadriev, V. A. Lastkin, “Silicon differential photodetectors. Technology, characteristics, application”, Zhurnal Tekhnicheskoi Fiziki, 93:9 (2023), 1353–1363
Linking options:
https://www.mathnet.ru/eng/jtf7171 https://www.mathnet.ru/eng/jtf/v93/i9/p1353
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