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Zhurnal Tekhnicheskoi Fiziki, 2022, Volume 92, Issue 6, Pages 889–891
DOI: https://doi.org/10.21883/JTF.2022.06.52520.279-21 (Mi jtf7373) 		 
Physical electronics

Auger analysis of thallium oxide formed using a low-energy beam of oxygen ions

O. G. Ashkhotov, I. B. Ashkhotova

Kabardino-Balkar State University, Nalchik, Russia
Full-text PDF (319 kB)
DOI: https://doi.org/10.21883/JTF.2022.06.52520.279-21
Abstract: The effect of irradiation with low-energy oxygen ions on the composition and some properties of the layer formed on the thallium surface has been studied. It is shown that bombardment with oxygen ions leads to the formation of a two-dimensional oxide layer, which effectively passivates the surface.
Keywords: layer, spectroscopy, surface, energy, composition, bombardment.
Received: 20.10.2021
Revised: 02.03.2022
Accepted: 29.03.2022
Bibliographic databases:
Document Type: Article
Language: Russian
Citation: O. G. Ashkhotov, I. B. Ashkhotova, “Auger analysis of thallium oxide formed using a low-energy beam of oxygen ions”, Zhurnal Tekhnicheskoi Fiziki, 92:6 (2022), 889–891
Citation in format AMSBIB
\Bibitem{AshAsh22}
\by O.~G.~Ashkhotov, I.~B.~Ashkhotova
\paper Auger analysis of thallium oxide formed using a low-energy beam of oxygen ions
\jour Zhurnal Tekhnicheskoi Fiziki
\yr 2022
\vol 92
\issue 6
\pages 889--891
\mathnet{http://mi.mathnet.ru/jtf7373}
\crossref{https://doi.org/10.21883/JTF.2022.06.52520.279-21}
\elib{https://elibrary.ru/item.asp?id=48291229}
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