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Zhurnal Tekhnicheskoi Fiziki, 2015, Volume 85, Issue 6, Pages 98–103 (Mi jtf7805)  
Physical science of materials

Melting of a thin aluminum film on a dielectric substrate under a high-power ion beam

V. S. Kovivchak, T. V. Panova, R. B. Burlakov

Omsk State University
Full-text PDF (856 kB)
Abstract: The effect of a high-power ion beam on thin aluminum films (0.3 and 1.9 $\mu$m thick) deposited onto dielectric substrates made of sodium-silicate glass and pyroceramics is studied. The main stages of changes in the surface morphology of a film, namely, its melting and transformation into an array of individual metal particles, are determined. Possible mechanisms of the detected phenomena are considered.
Received: 18.08.2014
English version:
Technical Physics, 2015, Volume 60, Issue 6, Pages 885–890
DOI: https://doi.org/10.1134/S1063784215060134
Bibliographic databases:
Document Type: Article
Language: Russian
Citation: V. S. Kovivchak, T. V. Panova, R. B. Burlakov, “Melting of a thin aluminum film on a dielectric substrate under a high-power ion beam”, Zhurnal Tekhnicheskoi Fiziki, 85:6 (2015), 98–103; Tech. Phys., 60:6 (2015), 885–890
Citation in format AMSBIB
\Bibitem{KovPanBur15}
\by V.~S.~Kovivchak, T.~V.~Panova, R.~B.~Burlakov
\paper Melting of a thin aluminum film on a dielectric substrate under a high-power ion beam
\jour Zhurnal Tekhnicheskoi Fiziki
\yr 2015
\vol 85
\issue 6
\pages 98--103
\mathnet{http://mi.mathnet.ru/jtf7805}
\elib{https://elibrary.ru/item.asp?id=24196112}
\transl
\jour Tech. Phys.
\yr 2015
\vol 60
\issue 6
\pages 885--890
\crossref{https://doi.org/10.1134/S1063784215060134}
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