Atomic-molecular model of boundary friction in microtribocontacts between the surfaces of semiconducting and dielectric materials

The mechanisms of mechanical and molecular friction between semiconducting and dielectric substrates during the tribometric interaction of their surfaces are analyzed. We consider the possibility of application of the Kragel'skii theory for analytical determination of the mechanical component of the friction force and of the adhesive model of friction, which establishes the interrelation between the parameters of point tribometric interaction between the substrates with the same degree of contamination and the concentration of organic molecules adsorbed by the surface. The resultant analytic dependence makes it possible to determine the concentration of atoms and molecules to within 10$^{-10}$ g/cm$^2$. The discrepancy between theoretical and experimental results does not exceed 18%.