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Zhurnal Tekhnicheskoi Fiziki, 2015, Volume 85, Issue 12, Pages 124–127 (Mi jtf7968)  
Physical electronics

Universal method for experimental determination of evaporating electric field strengths for field ion emitters

O. L. Golubev

Ioffe Institute, St. Petersburg
Full-text PDF (248 kB)
Abstract: An original method for experimental determination of evaporating field strengths $F_{ev}$ for field emitters is described. The method is universal and can be used for any field emitters, including nanosize protrusions grown in situ on the surface of such emitters to improve the emission localization. The examples of determining the values of $F_{ev}$ for emitters made of some metals are given and the restrictions of the method are analyzed.
Received: 04.06.2015
English version:
Technical Physics, 2015, Volume 60, Issue 12, Pages 1859–1862
DOI: https://doi.org/10.1134/S106378421512004X
Bibliographic databases:
Document Type: Article
Language: Russian
Citation: O. L. Golubev, “Universal method for experimental determination of evaporating electric field strengths for field ion emitters”, Zhurnal Tekhnicheskoi Fiziki, 85:12 (2015), 124–127; Tech. Phys., 60:12 (2015), 1859–1862
Citation in format AMSBIB
\Bibitem{Gol15}
\by O.~L.~Golubev
\paper Universal method for experimental determination of evaporating electric field strengths for field ion emitters
\jour Zhurnal Tekhnicheskoi Fiziki
\yr 2015
\vol 85
\issue 12
\pages 124--127
\mathnet{http://mi.mathnet.ru/jtf7968}
\elib{https://elibrary.ru/item.asp?id=24196276}
\transl
\jour Tech. Phys.
\yr 2015
\vol 60
\issue 12
\pages 1859--1862
\crossref{https://doi.org/10.1134/S106378421512004X}
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