|
|
Zhurnal Tekhnicheskoi Fiziki, 2014, Volume 84, Issue 1, Pages 104–108
(Mi jtf7988)
|
|
|
|
This article is cited in 5 scientific papers (total in 5 papers)
Optics
Optical properties of BiFeO$_3$ epitaxial thin films
V. B. Shirokovab, Yu. I. Golovkoa, V. M. Mukhortovab a Southern Research Center of the Russian Academy of Sciences, Rostov-on-Don
b Southern Federal University, Rostov-on-Don
Abstract:
The properties of neodymium-doped BiFeO$_3$ nanosized films on magnesium oxide single-crystal substrates are studied. The films are obtained using high-frequency sputtering with the aid of layered growth. The structural perfection of the films is analyzed using the X-ray diffraction. The transmission of the films with different thicknesses is studied in the wavelength interval 200–1100 nm. The spectra are processed with the aid of a dispersion formula for permittivity of a sum of oscillators with allowance for damping, so that direct and indirect transitions can be revealed. The absorption edges are estimated to be 2.81 and 2.78 eV for the direct transitions of the films with thicknesses of 14 and 60 nm, respectively.
Received: 13.12.2012
Citation:
V. B. Shirokov, Yu. I. Golovko, V. M. Mukhortov, “Optical properties of BiFeO$_3$ epitaxial thin films”, Zhurnal Tekhnicheskoi Fiziki, 84:1 (2014), 104–108; Tech. Phys., 59:1 (2014), 102–106
Linking options:
https://www.mathnet.ru/eng/jtf7988 https://www.mathnet.ru/eng/jtf/v84/i1/p104
|
| Statistics & downloads: |
| Abstract page: | 27 | | Full-text PDF : | 22 |
|